Effect of OK bonds on persistent spectral hole burning of Sm2+-doped glasses

被引:19
作者
Nogami, M [1 ]
Hiraga, T [1 ]
Hayakawa, T [1 ]
机构
[1] Nagoya Inst Technol, Dept Mat Sci & Engn, Showa Ku, Nagoya, Aichi 4668555, Japan
关键词
D O I
10.1016/S0022-3093(98)00771-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Persistent spectral hole burning (PSHB) was investigated in Sm2+-doped Al2O3. 9SiO(2) glass samples with and without OH bonds. The holes were burned in the F-7(0) --> D-5(0) line of the Sm2+ ions using a Q-switched Nd:YAG laser-pumped dye laser at 77 K. Holes with the depth of about 40% were burned in the samples containing OH bonds, which decreased with increasing time and temperature and reached the depth of one-third of the initial one. On the other hand, the glass containing no OH bonds had a hole depth of about 15%, which was not erased after heating to room temperature. We conclude that the PSHB was formed by both the photo-induced rearrangement of the OH bonds and the photoionization of Sm2+ ions, and the holes burned by the rearrangement of the OH bonds were thermally refilled. (C) 1998 Elsevier Science B.V. All rights reserved.
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页码:98 / 104
页数:7
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