Effect of OK bonds on persistent spectral hole burning of Sm2+-doped glasses

被引：19

作者：

Nogami, M ^{[1
]}

Hiraga, T ^{[1
]}

Hayakawa, T ^{[1
]}

机构：

[1] Nagoya Inst Technol, Dept Mat Sci & Engn, Showa Ku, Nagoya, Aichi 4668555, Japan

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1998年 / 241卷 / 2-3期

关键词：

D O I：

10.1016/S0022-3093(98)00771-6

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Persistent spectral hole burning (PSHB) was investigated in Sm2+-doped Al2O3. 9SiO(2) glass samples with and without OH bonds. The holes were burned in the F-7(0) --> D-5(0) line of the Sm2+ ions using a Q-switched Nd:YAG laser-pumped dye laser at 77 K. Holes with the depth of about 40% were burned in the samples containing OH bonds, which decreased with increasing time and temperature and reached the depth of one-third of the initial one. On the other hand, the glass containing no OH bonds had a hole depth of about 15%, which was not erased after heating to room temperature. We conclude that the PSHB was formed by both the photo-induced rearrangement of the OH bonds and the photoionization of Sm2+ ions, and the holes burned by the rearrangement of the OH bonds were thermally refilled. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：98 / 104

页数：7

共 18 条

[1] LASER-INDUCED FLUORESCENCE LINE NARROWING IN EU GLASS - SPECTROSCOPIC ANALYSIS OF COORDINATION STRUCTURE [J].