Metrological comparison of terrestrial laser scanning systems Riegl LMS Z390i and Trimble GX

被引:12
作者
Gonzalez-Jorge, Higinio [1 ]
Rodriguez-Gonzalvez, Pablo [2 ]
Gonzalez-Aguilera, Diego [2 ]
Varela-Gonzalez, Maria [1 ]
机构
[1] Univ Vigo, Sch Min Engn, Close Range Remote Sensing & Photogrammetry Grp, Nat Resources & Environm Engn Dept, Vigo 36310, Spain
[2] Univ Salamanca, High Polytech Sch Avila, TIDOP Res Grp, Cartog & Land Engn Dept, Avila 05003, Spain
关键词
metrology; laser scanning; verification; DIMENSIONAL METROLOGY; RANGE;
D O I
10.1117/1.3646395
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A low cost physical artifact with traceability to the national standard - meter is used for the metrological comparison of two terrestrial laser scanning systems: Riegl LMS Z390i and Trimble GX. The artifact is based on five spheres equidistantly situated and seven cubes of different dimensions. Accuracy and repeatability are evaluated using least squares fitting (LSF) and random sample consensus algorithms, for the study case of the spheres, and plane LSF and statistical analysis for the cubes. The horizontal resolution is evaluated using a modulated transfer function approach and the vertical one with the accuracy and repeatability data along Z axis. The Trimble system shows better results for all parameters, artifact parts, and algorithms under study. (C) 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.3646395]
引用
收藏
页数:9
相关论文
共 24 条
[1]  
Arias P., 2007, International Journal of Simulation Modelling, V6, P65, DOI 10.2507/IJSIMM06(2)S.01
[2]   Modelling masonry arches shape using terrestrial laser scanning data and nonparametric methods [J].
Armesto, J. ;
Roca-Pardinas, Javier ;
Lorenzo, H. ;
Arias, P. .
ENGINEERING STRUCTURES, 2010, 32 (02) :607-615
[3]  
BERENYA A, 2009, CIVIL ENG, V53, P25
[4]  
*BIPM, 1997, ANSI NSSL GUID EXPR
[5]  
Boehler W., 2003, INT ARCH PHOTOGRAMME, V34, P696, DOI [DOI 10.1002/PBC.ABSTRACT, 10.1002/pbc.ABSTRACT]
[6]  
Burns PA, 2000, PICS 2000: IMAGE PROCESSING, IMAGE QUALITY, IMAGE CAPTURE, SYSTEMS CONFERENCE, PROCEEDINGS, P135
[7]  
BURNS PD, 2001, P TUT NOT IS T C MON
[8]  
Edlen B., 1966, Metrologia, V2, P71, DOI DOI 10.1088/0026-1394/2/2/002
[9]   RANDOM SAMPLE CONSENSUS - A PARADIGM FOR MODEL-FITTING WITH APPLICATIONS TO IMAGE-ANALYSIS AND AUTOMATED CARTOGRAPHY [J].
FISCHLER, MA ;
BOLLES, RC .
COMMUNICATIONS OF THE ACM, 1981, 24 (06) :381-395
[10]   Trimble GX200 and Riegl LMS-Z390i sensor self-calibration [J].
Gonzalez-Aguilera, D. ;
Rodriguez-Gonzalvez, P. ;
Armesto, J. ;
Arias, P. .
OPTICS EXPRESS, 2011, 19 (03) :2676-2693