Effects of Surface Finish on the Shear Fatigue of SAC-Based Solder Alloys

被引:13
作者
Su, Sinan [1 ]
Jian, Minghong [1 ]
Hamasha, Sa'd [1 ]
机构
[1] Auburn Univ, Dept Ind & Syst Engn, Auburn, AL 36849 USA
来源
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 2020年 / 10卷 / 03期
关键词
Soldering; Fatigue; Surface finishing; Metals; Testing; Semiconductor device reliability; solder joint; surface finish; SN-AG-CU; BALL SHEAR; INTERFACIAL REACTION; BI; LIFE; RELIABILITY; STRENGTH; JOINTS; MICROSTRUCTURE; SNAGCU;
D O I
10.1109/TCPMT.2019.2942806
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Solder joints in electronic assemblies are subjected to mechanical cycling in normal operating conditions. Testing individual solder joint in mechanical cycling allows monitoring the evolution of hysteresis loop with time and provides the ability to study the factors that affect the reliability. In this article, the effect of surface finish on the fatigue behaviors of four doped lead-free solder alloys (CycloMax, Innolot, Ecolloy, and SAC-X-Plus) and SAC305 was investigated. Individual solder joints with three surface finishes [organic solderability preservative (OSP), immersion silver (ImAg), and electroless nickel immersion gold (ENIG)] were prepared and subjected to various cyclic shear stress loadings until complete failure. Hysteresis loop was systematically recorded using an Instron machine. Characteristic fatigue life and energy dissipation per cycle were analyzed, and the Morrow energy model was applied to empirically predict the fatigue life as a function of work dissipation. Failure mechanisms were investigated as well using SEM/EDS, and the results were correlated with the fatigue behavior of the solder joints. The results indicated that the fatigue resistance of the solder alloys decreased with the increase in stress amplitude. The fatigue resistance of the solder joints with OSP and ImAg surface finishes outperformed ENIG surface finish. CycloMax with OSP surface finish was associated with the best fatigue resistance, while SAC-X-Plus with ENIG surface finish was associated with the worst fatigue resistance. Three failure modes were detected in this study: ductile, brittle, and near-intermetallic compound (IMC) failure. It was also found that Innolot with ENIG surface finish is more susceptible to brittle failure because of the excessive brittleness associated with this alloy.
引用
收藏
页码:457 / 466
页数:10
相关论文
共 41 条
  • [1] Akkara F., 2017, SMTA INT C, P17
  • [2] Akkara FJ, 2018, INTSOC CONF THERMAL, P1374, DOI 10.1109/ITHERM.2018.8419534
  • [3] Comparison of isothermal mechanical fatigue properties of lead-free solder joints and bulk solders
    Andersson, C
    Lai, Z
    Liu, J
    Jiang, H
    Yu, Y
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2005, 394 (1-2): : 20 - 27
  • [4] Study of immersion silver and tin printed-circuit-board surface finishes in lead-free solder applications
    Arra, M
    Shangguan, D
    Xie, DJ
    Sundelin, J
    Lepisto, T
    Ristolainen, E
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (09) : 977 - 990
  • [5] Solder joint reliability under realistic service conditions
    Borgesen, P.
    Hamasha, S.
    Obaidat, M.
    Raghavan, V.
    Dai, X.
    Meilunas, M.
    Anselm, M.
    [J]. MICROELECTRONICS RELIABILITY, 2013, 53 (9-11) : 1587 - 1591
  • [6] Borgesen P., 2016, 2016 PAN PACIFIC MIC, P1, DOI [10.1109/Pan-Pacific.2016.7428390, DOI 10.1109/PANPACIFIC.2016.7428390]
  • [7] The mechanics of the solder ball shear test and the effect of shear rate
    Chia, JYH
    Cotterell, B
    Chai, TC
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 417 (1-2): : 259 - 274
  • [8] Chowdhury MM, 2018, INTSOC CONF THERMAL, P1324, DOI 10.1109/ITHERM.2018.8419523
  • [9] Characterization of Material Damage and Microstructural Evolution Occurring in Lead Free Solders Subjected to Cyclic Loading
    Chowdhury, Md Mahmudur R.
    Hoque, Mohd Aminul
    Fu, Nianjun
    Suhling, Jeffrey C.
    Hamasha, Sa'd
    Lall, Pradeep
    [J]. 2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018), 2018, : 865 - 874
  • [10] Gordon S., 2017, P SMTA INT SEP