Structure control and ferroelectric properties of SrBi4Ti4O15 thin films on Si substrates coated by (100)and (110)-oriented LaNiO3 electrodes

被引：0

作者：

Wang, Pilong

Hu, Guangda ^{[1
]}

Ding, Yanxia

Fan, Shuhua

机构：

[1] Univ Jinan, Sch Mat Sci & Engn, Jinan 250022, Peoples R China

[2] Shandong Jianzhu Univ, Coll Mat Sci & Engn, Jinan 250101, Peoples R China

来源：

SURFACE REVIEW AND LETTERS | 2007年 / 14卷 / 03期

基金：

中国国家自然科学基金;

关键词：

SrBi4Ti4O15 thin film; LaNiO3 thin film; metalorganic decomposition; epitaxial growth;

D O I：

10.1142/S0218625X07009554

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

SrBi4Ti4O15 ( SBTi) thin films were prepared on ( 100)- and ( 110)- oriented LaNiO3( LNO) electrodes by a metalorgranic decomposition ( MOD) technique at an annealing temperature of 650 degrees C. c-axis-oriented SBTi thin film with volume fraction of 0.89 can be formed on a ( 100)oriented LNO film due to the epitaxial relationship between c-axis-oriented SBTi and LNO( 100). In contrast, SBTi film deposited on LNO( 110) shows random orientations with strong ( 119) and ( 200) peaks. The remanent polarization ( P-r) and coercive field ( E-c) of the random oriented SBTi film were 18.1 mu C/cm(2) and 70 kV/ cm, respectively. This suggests that ( 110)- oriented LNO electrode is a better choice for obtaining SBTi films with higher volume fraction ofa( b)- axisorientated grains.

引用

页码：435 / 438

页数：4