AC and DC Electrical Strength of Thermally Conductive Insulating Foils under Various Conditions

被引:0
作者
Scheler, Martin [1 ]
Reisenweber, Lukas [1 ]
Hetzel, Sabrina [1 ]
Fischer, Tobias [1 ]
Rossner, Michael [1 ]
Stadler, Alexander [1 ]
Pohl, Wilhelm [2 ]
机构
[1] Coburg Univ Appl Sci & Arts, Dept Elect Engn & Comp Sci, Coburg, Germany
[2] HALA Contec GmbH & Co KG, Ottobrunn, Germany
来源
2022 IEEE ELECTRICAL INSULATION CONFERENCE (EIC) | 2022年
关键词
Electrical strength; breakdown; thermal conductive; Weibull; silicone foil; ceramic filler; enlargement law;
D O I
10.1109/EIC51169.2022.9833157
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work we present the results of AC and DC breakdown voltage measurements on thermally conductive insulating foil sheets. The aim is to derive suitable voltage values for a nondestructive electrical strength test. The voltages are as high as possible without producing too many rejects. From the different test methods for breakdown measurements, we choose the method that delivers the lowest breakdown voltages. The effect of different voltage rise rates is investigated and a suitable rise rate is derived. The thickness and area dependency of the foils to the breakdown voltage is investigated and discussed. Rectangular electrode surfaces are preferred for testing sheets. Therefore, we investigate the difference between circular and rectangular electrode geometries on the breakdown results. Furthermore, we propose a method for scaling the obtained test voltages to different foil sheet dimensions which is based on the enlargement law. The prerequisite is that breakdowns with extensive random samples are performed on a known arrangement. Because the enlargement law is not valid in all cases, it is necessary to perform breakdown measurements on the scaled arrangement for referencing. For a small number of samples, the method delivers low probability breakdown voltages more accurate than performing statistical analysis on the scaled arrangement.
引用
收藏
页码:424 / 430
页数:7
相关论文
共 9 条
  • [1] [Anonymous], 2020, D375520 ASTM
  • [2] [Anonymous], 2020, D14920 ASTM
  • [3] Dissado LA, 1992, ELECT DEGRADATION BR, P207
  • [4] Hauschild W., 1992, Statistical techniques for high-voltage engineering
  • [5] Kuchler A, 2018, HIGH VOLTAGE ENG, P147
  • [6] Nelson W.B., 1982, APPL LIFE DATA ANAL
  • [7] Reissenweber L., 2022, IEEE ELECT INSULATIO
  • [8] Stapelberg R.F., 2009, HDB RELIABILITY AVAI
  • [9] Automatic Breakdown Voltage Measurement of Polymer Films
    Xu, Chunchuan
    Ho, Janet
    Boggs, Steven A.
    [J]. IEEE ELECTRICAL INSULATION MAGAZINE, 2008, 24 (06) : 30 - 34