Terahertz Radiation from Nonpolar InN Due to Drift in an Intrinsic In-Plane Electric Field

被引:17
作者
Metcalfe, Grace D. [1 ]
Shen, Hongen [1 ]
Wraback, Michael [1 ]
Koblmueller, Gregor [2 ,3 ,4 ]
Gallinat, Chad [1 ,2 ]
Wu, Feng [2 ]
Speck, James S. [2 ]
机构
[1] USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[3] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
[4] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany
关键词
D O I
10.1143/APEX.3.092201
中图分类号
O59 [应用物理学];
学科分类号
摘要
A sinusoidal dependence of the s- and p-polarized terahertz (THz) emission on sample rotation angle in m- and a-plane InN has been observed using ultrafast pulse excitation at a moderate pump fluence of similar to 1 mu J/cm(2). The angular dependence is attributed to carrier drift in an intrinsic in-plane electric field parallel to the c-axis induced by stacking fault-terminated internal polarization at wurtzite domain boundaries, with a THz polarity flip corresponding to a reversal of the c-axis. The p-polarized THz signal also consists of an angular-independent component, similar to that from c-plane InN, consistent with surface normal transport due to the photo-Dember effect. (c) 2010 The Japan Society of Applied Physics
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页数:3
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