Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays

被引:24
作者
Tintelott, Marcel [1 ]
Pachauri, Vivek [1 ]
Ingebrandt, Sven [1 ]
Vu, Xuan Thang [1 ]
机构
[1] Rhein Westfal TH Aachen, Inst Mat Elect Engn 1, Sommerfeldstr 24, D-52074 Aachen, Germany
关键词
silicon nanowire field-effect transistor; device-to-device variation; biosensor; top-down fabrication; surface modification; FIELD-EFFECT TRANSISTOR; THRESHOLD VOLTAGE INSTABILITIES; LABEL-FREE; REFERENCE ELECTRODES; ELECTRICAL DETECTION; HIGH-PERFORMANCE; ISFET; IMMOBILIZATION; NANOSENSORS; ANTIBODIES;
D O I
10.3390/s21155153
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Silicon nanowire field-effect transistors (SiNW-FET) have been studied as ultra-high sensitive sensors for the detection of biomolecules, metal ions, gas molecules and as an interface for biological systems due to their remarkable electronic properties. "Bottom-up" or "top-down" approaches that are used for the fabrication of SiNW-FET sensors have their respective limitations in terms of technology development. The "bottom-up" approach allows the synthesis of silicon nanowires (SiNW) in the range from a few nm to hundreds of nm in diameter. However, it is technologically challenging to realize reproducible bottom-up devices on a large scale for clinical biosensing applications. The top-down approach involves state-of-the-art lithography and nanofabrication techniques to cast SiNW down to a few 10s of nanometers in diameter out of high-quality Silicon-on-Insulator (SOI) wafers in a controlled environment, enabling the large-scale fabrication of sensors for a myriad of applications. The possibility of their wafer-scale integration in standard semiconductor processes makes SiNW-FETs one of the most promising candidates for the next generation of biosensor platforms for applications in healthcare and medicine. Although advanced fabrication techniques are employed for fabricating SiNW, the sensor-to-sensor variation in the fabrication processes is one of the limiting factors for a large-scale production towards commercial applications. To provide a detailed overview of the technical aspects responsible for this sensor-to-sensor variation, we critically review and discuss the fundamental aspects that could lead to such a sensor-to-sensor variation, focusing on fabrication parameters and processes described in the state-of-the-art literature. Furthermore, we discuss the impact of functionalization aspects, surface modification, and system integration of the SiNW-FET biosensors on post-fabrication-induced sensor-to-sensor variations for biosensing experiments.
引用
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页数:23
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