Influence of Oxygen Content in Oriented LaCoO3-δ Thin Films: Probed by X-ray diffraction and Raman Spectroscopy

被引：0
|
作者：
Mishra, D. K. [1 ]
Ahlawat, Anju [1 ]
Sathe, V. G. [1 ]
机构：
[1] UGC DAE Consortium Sci Res, Indore 452001, Madhya Pradesh, India
来源：
SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B | 2011年 / 1349卷
关键词：
Lathanum cobaltite; thin films; oxygen content; strain; spins state transition; Raman study;
D O I：
10.1063/1.3606019
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Nonstoichiometric oriented thin films of LaCoO3(-delta) of equal thickness and varying oxygen content has been deposited on STO (001) substrate by pulsed laser deposition. X-ray diffraction results show that all films are single phase and c-axis oriented in the (001) direction with in plane tensile strain. In these films strain reduces with increasing oxygen content and Raman study also support this result. Low temperature Raman study shows no change in spin state of Co3+ in temperature range from 300K to down to 80K.
引用
收藏
页码：637 / 638
页数：2
相关论文
共 50 条
  • [31] X-ray diffraction line broadening from gold and platinum thin films
    Lynch, PA
    Cheary, RW
    Dooryhée, E
    Armstrong, N
    Tang, C
    EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2001, 378-3 : 358 - 363
  • [32] X-ray diffraction study of the reversemartensitic transformation in NiTi shapememory thin films
    Koker, M. K. A.
    Schaab, J.
    Zotov, N.
    Mittemeijer, E. J.
    THIN SOLID FILMS, 2013, 545 : 71 - 80
  • [33] Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction
    Birkholz, M.
    Darowski, N.
    Zizak, I.
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2008, : 263 - 271
  • [34] X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films
    Li, BQ
    Fujimoto, T
    Fukumoto, N
    Honda, K
    Kojima, I
    THIN SOLID FILMS, 1998, 334 (1-2) : 140 - 144
  • [35] X-ray and Raman study of spray pyrolysed vanadium oxide thin films
    Bouzidi, A.
    Benramdane, N.
    Bresson, S.
    Mathieu, C.
    Desfeux, R.
    El Marssi, M.
    VIBRATIONAL SPECTROSCOPY, 2011, 57 (02) : 182 - 186
  • [36] Nondestructive characterization of thin films and coatings using X-ray diffraction techniques
    Pineault, JA
    Drake, RJ
    Belassel, M
    Brauss, ME
    SURFACE ENGINEERING: COATING AND HEAT TREATMENTS, PROCEEDINGS, 2003, : 268 - 272
  • [37] Stress and texture in titanium nitride thin films by X-ray diffraction techniques
    Ducu, C.
    Moga, S.
    Negrea, D.
    Malinovschi, V.
    Balaceanu, M.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2010, 12 (05): : 1078 - 1082
  • [38] Raman and X-ray diffraction study of Ag-In-S polycrystals, films, and nanoparticles
    Azhniuk, Yuriy
    Gomonnai, Alexander V.
    Solonenko, Dmytro
    Loya, Vasyl
    Voynarovych, Ivan
    Lopushanska, Bohdana
    Roman, Ivan
    Lopushansky, Vasyl
    Zahn, Dietrich R. T.
    JOURNAL OF MATERIALS RESEARCH, 2023, 38 (08) : 2239 - 2250
  • [39] Highly constrained ferroelectric [BaTiO3](1-x)Λ/[BaZrO3]xΛ superlattices: X-ray diffraction and Raman spectroscopy
    Belhadi, J.
    El Marssi, M.
    Gagou, Y.
    Yuzyuk, Yu. I.
    El Mendili, Y.
    Raevski, I. P.
    Bouyanfif, H.
    Wolfman, J.
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (03)
  • [40] Ferroelectric phase transitions in tensile-strained NaNbO3 epitaxial films probed by in situ x-ray diffraction
    Guimaraes, Marilia de Oliveira
    Richter, Carsten
    Hanke, Michael
    Anooz, Saud Bin
    Wang, Yankun
    Schwarzkopf, Jutta
    Schmidbauer, Martin
    JOURNAL OF APPLIED PHYSICS, 2022, 132 (15)
12345