Influence of Oxygen Content in Oriented LaCoO3-δ Thin Films: Probed by X-ray diffraction and Raman Spectroscopy

被引：0
|
作者：
Mishra, D. K. [1 ]
Ahlawat, Anju [1 ]
Sathe, V. G. [1 ]
机构：
[1] UGC DAE Consortium Sci Res, Indore 452001, Madhya Pradesh, India
来源：
SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B | 2011年 / 1349卷
关键词：
Lathanum cobaltite; thin films; oxygen content; strain; spins state transition; Raman study;
D O I：
10.1063/1.3606019
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Nonstoichiometric oriented thin films of LaCoO3(-delta) of equal thickness and varying oxygen content has been deposited on STO (001) substrate by pulsed laser deposition. X-ray diffraction results show that all films are single phase and c-axis oriented in the (001) direction with in plane tensile strain. In these films strain reduces with increasing oxygen content and Raman study also support this result. Low temperature Raman study shows no change in spin state of Co3+ in temperature range from 300K to down to 80K.
引用
收藏
页码：637 / 638
页数：2
相关论文
共 50 条
  • [1] Oxygen vacancies in PbTiO3 thin films probed by resonant Raman spectroscopy
    Nishida, Ken
    Osada, Minoru
    Sakai, Joe
    Ito, Nobuaki
    Katoda, Takashi
    Ikariyama, Rikyu
    Funakubo, Hiroshi
    Moriwake, Hiroki
    Yamamoto, Takashi
    JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2013, 121 (1416) : 598 - 601
  • [2] Modified Oxygen Defect Chemistry at Transition Metal Oxide Heterostructures Probed by Hard X-ray Photoelectron Spectroscopy and X-ray Diffraction
    Chen, Yan
    Fong, Dillon D.
    Herbert, F. William
    Rault, Julien
    Rueff, Jean-Pascal
    Tsvetkov, Nikolai
    Yildiz, Bilge
    CHEMISTRY OF MATERIALS, 2018, 30 (10) : 3359 - 3371
  • [3] X-ray diffraction, Raman and photoluminescence studies of nanocrystalline cerium oxide thin films
    Balakrishnan, G.
    Raghavan, C. M.
    Ghosh, C.
    Divakar, R.
    Mohandas, E.
    Song, Jung Il
    Bae, S. I.
    Kim, Tae Gyu
    CERAMICS INTERNATIONAL, 2013, 39 (07) : 8327 - 8333
  • [4] Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
    Nam, Dahyun
    Opanasyuk, A. S.
    Koval, P. V.
    Ponomarev, A. G.
    Jeong, Ah Reum
    Kim, Gee Yeong
    Jo, William
    Cheong, Hyeonsik
    THIN SOLID FILMS, 2014, 562 : 109 - 113
  • [5] X-ray diffraction investigations of thin gold films
    Mattern, N.
    Riedel, A.
    Weise, G.
    Materials Science Forum, 1994, 166-169 (pt 1) : 287 - 292
  • [6] X-ray diffraction characterization of thin superconductive films
    Kozaczek, KJ
    Book, GW
    Watkins, TR
    Carter, WB
    NONDESTRUCTIVE CHARACTERIZATION OF MATERIALS VII, PTS 1 AND 2, 1996, 210-2 : 203 - 210
  • [7] Phase composition of selenized Cu2ZnSnSe4 thin films determined by X-ray diffraction and Raman spectroscopy
    Ganchev, M.
    Iljina, J.
    Kaupmees, L.
    Raadik, T.
    Volobujeva, O.
    Mere, A.
    Altosaar, M.
    Raudoja, J.
    Mellikov, E.
    THIN SOLID FILMS, 2011, 519 (21) : 7394 - 7398
  • [8] X-ray diffraction spectroscopy and X-ray photoelectron spectroscopy studies of Cu-doped ZnO films
    Xue, H.
    Chen, Y.
    Xu, X. L.
    Zhang, G. H.
    Zhang, H.
    Ma, S. Y.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 41 (05): : 788 - 791
  • [9] X-ray diffraction study of the structure of thin polyfluorene films
    Kawana, S
    Durrell, M
    Lu, J
    Macdonald, JE
    Grell, M
    Bradley, DDC
    Jukes, PC
    Jones, RAL
    Bennett, SL
    POLYMER, 2002, 43 (06) : 1907 - 1913
  • [10] Structural properties of low-temperature grown ZnO thin films determined by X-ray diffraction and X-ray absorption spectroscopy
    Yu, Chung-Jong
    Sung, Nark-Eon
    Lee, Han-Koo
    Shin, Hyun-Joon
    Yun, Young-Duck
    Kang, Seen-Woong
    Lee, Ik-Jae
    THIN SOLID FILMS, 2011, 519 (13) : 4366 - 4370
12345