ADAPTIVE MAXIMUM MARGIN CRITERION FOR IMAGE CLASSIFICATION

被引:0
作者
Lu, Jiwen [1 ]
Tan, Yap-Peng [1 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore, Singapore
来源
2011 IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA AND EXPO (ICME) | 2011年
关键词
Image classification; subspace learning; adaptive; discriminant analysis; DIMENSIONALITY REDUCTION; FEATURE-EXTRACTION; DISCRIMINANT; EIGENFACES;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We propose in this paper a novel adaptive maximum margin criterion (AMMC) method for image classification. While a large number of discriminant analysis algorithms have been proposed in recent years, most of them consider an equal importance of each training sample and ignore the different contributions of these samples to learn the discriminative feature subspace for classification. Motivated by the fact that some training samples are more effectual in learning the low-dimensional feature space than other samples, we propose using different weights to characterize the different contributions of the training samples and incorporate such weighting information into the popular maximum margin criterion algorithm to devise the corresponding AMMC for image classification. Moreover, we extend the proposed MMC algorithm to the semi-supervised case, namely, semi-supervised adaptive maximum margin criterion (SAMMC), by making use of both labeled and unlabeled samples to further improve the classification performance. Experimental results are presented to demonstrate the efficacy of the proposed methods.
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页数:6
相关论文
共 28 条
[1]  
[Anonymous], 2007, PROC IEEE INT C COMP
[2]  
[Anonymous], IEEE SIGNAL PROCESSI
[3]  
[Anonymous], 2007, IJCAI
[4]   Eigenfaces vs. Fisherfaces: Recognition using class specific linear projection [J].
Belhumeur, PN ;
Hespanha, JP ;
Kriegman, DJ .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1997, 19 (07) :711-720
[5]   Laplacian eigenmaps for dimensionality reduction and data representation [J].
Belkin, M ;
Niyogi, P .
NEURAL COMPUTATION, 2003, 15 (06) :1373-1396
[6]  
Chen HT, 2005, PROC CVPR IEEE, P846
[7]   Correlation Metric for Generalized Feature Extraction [J].
Fu, Yun ;
Yan, Shuicheng ;
Huang, Thomas S. .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2008, 30 (12) :2229-2235
[8]   Classification and feature extraction by simplexization [J].
Fu, Yun ;
Yan, Shuicheng ;
Huang, Thomas S. .
IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 2008, 3 (01) :91-100
[9]  
He XF, 2005, IEEE I CONF COMP VIS, P1208
[10]   Face recognition using Laplacianfaces [J].
He, XF ;
Yan, SC ;
Hu, YX ;
Niyogi, P ;
Zhang, HJ .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2005, 27 (03) :328-340