Initial stages of the epitaxial growth of Pr2O3 on Si(111) studied by LEED and STM

被引:12
作者
Libralesso, L
Schroeder, T
Lee, TL
Zegenhagen, J
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] IHP, D-15236 Frankfurt, Germany
关键词
low energy electron diffraction (LEED); molecular beam epitaxy; scanning tunneling microscopy; growth; nucleation; surface structure; morphology; roughness; and topography; semiconductor-insulator interfaces; low index single crystal surfaces;
D O I
10.1016/j.susc.2005.08.026
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The initial stages of the molecular beam epitaxy growth of Pr2O3 on atomically clean Si(111) have been studied in ultra-high vacuum by low energy electron diffraction and scanning tunneling microscopy. At very low coverages, the oxide nuclei decorate the dimer rows of the silicon surface as line structure forming open triangles. At higher coverages, two-dimensional, equilateral, triangular islands with a fairly narrow size distribution and a well defined thickness are observed. Island nucleation occurs both at step edges and on the terraces. Upon coalescence at coverages beyond one monolayer, the surface is covered by a flat and pseudomorphic oxide film with a (1 x 1) surface unit cell. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:L347 / L354
页数:8
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