A highly strained GaAs/GaAS(0.64)Sb(0.36) single quantum well laser has been grown on GaAs (100) substrate by using solid source molecular beam epitaxy. The uncoated broad-area laser demonstrates 1.292 mum pulsed operation with a low threshold current density of 300 A/cm(2). The spontaneous emission of the laser was also studied. The result reveals that the Auger recombination component dominates the threshold current at high temperature.
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Yamada, M
;
Anan, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Anan, T
;
Tokutome, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Tokutome, K
;
Kamei, A
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Kamei, A
;
Nishi, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Nishi, K
;
Sugou, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Yamada, M
;
Anan, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Anan, T
;
Tokutome, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Tokutome, K
;
Kamei, A
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Kamei, A
;
Nishi, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan
Nishi, K
;
Sugou, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, JapanNEC Corp Ltd, High Frequency Device Res Labs, Tsukuba, Ibaraki 3058501, Japan