Direct Imaging of a Two-Dimensional Silica Glass on Graphene

被引:239
作者
Huang, Pinshane Y. [2 ]
Kurasch, Simon [1 ]
Srivastava, Anchal [3 ]
Skakalova, Viera [3 ,4 ]
Kotakoski, Jani [4 ,5 ]
Krasheninnikov, Arkady V. [5 ,6 ]
Hovden, Robert [2 ]
Mao, Qingyun [2 ]
Meyer, Jannik C. [1 ,4 ]
Smet, Jurgen [3 ]
Muller, David A. [2 ,7 ]
Kaiser, Ute [1 ]
机构
[1] Univ Ulm, Electron Microscopy Grp Mat Sci, D-89081 Ulm, Germany
[2] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA
[3] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
[4] Univ Vienna, Dept Phys, A-1090 Vienna, Austria
[5] Univ Helsinki, Dept Phys, Helsinki 00014, Finland
[6] Aalto Univ, Dept Appl Phys, Aalto 00076, Finland
[7] Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA
基金
美国国家科学基金会; 芬兰科学院;
关键词
two-dimensional glass; 2D silica; SiO2; transmission electron microscopy; graphene imaging substrates; Zachariasen's model; ATOMIC-SCALE;
D O I
10.1021/nl204423x
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Large-area graphene substrates provide a promising lab bench for synthesizing, manipulating, and characterizing low-dimensional materials, opening the door to high-resolution analyses of novel structures, such as two-dimensional (2D) glasses, that cannot be exfoliated and may not occur naturally. Here, we report the accidental discovery of a 2D silica glass supported on graphene. The 2D nature of this material enables the first atomic resolution transmission electron microscopy of a glass, producing images that strikingly resemble Zachariasen's original 1932 cartoon models of 2D continuous random network glasses. Atomic-resolution electron spectroscopy identifies the glass as SiO2 formed from a bilayer of (SiO4)(2-) tetrahedra and without detectable covalent bonding to the graphene. From these images, we directly obtain ring statistics and pair distribution functions that span short-, medium-, and long-range order. Ab initio calculations indicate that van der Waals interactions with graphene energetically stabilizes the 2D structure with respect to bulk SiO2. These results demonstrate a new class of 2D glasses that can be applied in layered graphene devices and studied at the atomic scale.
引用
收藏
页码:1081 / 1086
页数:6
相关论文
共 30 条
[1]   STRUCTURE OF VITREOUS-SILICA - VALIDITY OF RANDOM NETWORK THEORY [J].
BELL, RJ ;
DEAN, P .
PHILOSOPHICAL MAGAZINE, 1972, 25 (06) :1381-&
[2]  
Cliffe M.J., 2010, PHYS REV LETT, P104
[3]   The study of nanovolumes of amorphous materials using electron scattering [J].
Cockayne, David J. H. .
ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 :159-187
[4]  
Egerton R.F., 1996, ELECT ENERGY LOSS SP
[5]   Electron microscopy image enhanced [J].
Haider, M ;
Uhlemann, S ;
Schwan, E ;
Rose, H ;
Kabius, B ;
Urban, K .
NATURE, 1998, 392 (6678) :768-769
[6]   NETWORK TOPOLOGY IN APERIODIC NETWORKS [J].
HOBBS, LW .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1995, 193 :79-91
[7]   Application of electron optical techniques to the study of amorphous materials [J].
Howie, A. .
PHILOSOPHICAL MAGAZINE, 2010, 90 (35-36) :4647-4660
[8]   Grains and grain boundaries in single-layer graphene atomic patchwork quilts [J].
Huang, Pinshane Y. ;
Ruiz-Vargas, Carlos S. ;
van der Zande, Arend M. ;
Whitney, William S. ;
Levendorf, Mark P. ;
Kevek, Joshua W. ;
Garg, Shivank ;
Alden, Jonathan S. ;
Hustedt, Caleb J. ;
Zhu, Ye ;
Park, Jiwoong ;
McEuen, Paul L. ;
Muller, David A. .
NATURE, 2011, 469 (7330) :389-+
[9]   Towards sub-Å electron beams [J].
Krivanek, OL ;
Dellby, N ;
Lupini, AR .
ULTRAMICROSCOPY, 1999, 78 (1-4) :1-11
[10]   The Atomic Structure of a Metal-Supported Vitreous Thin Silica Film [J].
Lichtenstein, Leonid ;
Buechner, Christin ;
Yang, Bing ;
Shaikhutdinov, Shamil ;
Heyde, Markus ;
Sierka, Marek ;
Wlodarczyk, Radoslaw ;
Sauer, Joachim ;
Freund, Hans-Joachim .
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2012, 51 (02) :404-407