10 Volt Automated Direct Comparison of Two Cryocooled Programmable Josephson Voltage Standards

被引：0

作者：

Rufenacht, Alain ^{[1
]}

Tang, Yi-hua ^{[2
]}

Fox, Anna E. ^{[1
]}

Dresselhaus, Paul D. ^{[1
]}

Burroughs, Charles J. ^{[1
]}

Schwall, Robert E. ^{[1
]}

Benz, Samuel P. ^{[1
]}

机构：

[1] NIST, Boulder, CO 80305 USA

[2] NIST, Gaithersburg, MD 20899 USA

来源：

2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016) | 2016年

关键词：

Josephson arrays; Precision measurements; Uncertainty; Voltage measurement;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have performed direct dc comparisons between two cryocooled 10 V programmable Josephson voltage standards utilizing an automated synchronization scheme for the voltage reversals, which enables the use of a high sensitivity null detector on its 3 mu V range by preventing any overload condition. No switches or manual operations are necessary to protect the null detector. Comparing the two systems under various test conditions provides robust verification of ideal system performance, and enables verification of the key components of the uncertainty budget for both the measurement methods and system operations.

引用

页数：2

共 4 条

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Ruefenacht, Alain
Howe, Logan A.
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Schwall, Robert E.
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Burroughs, Charles J., Jr.
Benz, Samuel P.
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 64 (06) : 1477 - 1482
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Solve, S.
Ruefenacht, A.
Burroughs, C. J.
Benz, S. P.
[J]. METROLOGIA, 2013, 50 (05) : 441 - 451

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