共 21 条
Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram
被引:168
作者:

Miccio, L.
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机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

Alfieri, D.
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h-index: 0
机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

Grilli, S.
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h-index: 0
机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

Ferraro, P.
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机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

Finizio, A.
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机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

De Petrocellis, L.
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机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy

Nicola, S. D.
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机构: CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy
机构:
[1] CNR, Ist Nazl Ott Applicata, I-80078 Pozzuoli, Napoli, Italy
[2] CNR, Ist Cibernet E Caianiello, I-80078 Pozzuoli, Napoli, Italy
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D O I:
10.1063/1.2432287
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Aberrations and the distortions due to the imaging optics can be compensated in quantitative phase microscopy of thin phase objects by digital holography using a single hologram. The reconstructed quantitative phase microscopy phase distribution map can be directly corrected in the reconstructed image plane by a numerical method. To remove this unwanted aberration, in the special case of thin objects, the authors perform a two-dimensional fit with the Zernike polynomials of the reconstructed unwrapped phase. Subtraction of the fitted polynomial from the original phase map gives quantitative phase microscopy phase map free of aberrations. (c) 2007 American Institute of Physics.
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