In situ small angle x-ray scattering, wide angle x-ray scattering, and Raman spectroscopy of microwave synthesis

被引:18
作者
Tompsett, G. A.
Panzarella, B.
Conner, W. C.
Yngvesson, K. S.
Lu, F.
Suib, S. L.
Jones, K. W.
Bennett, S.
机构
[1] Univ Massachusetts, Dept Chem Engn, Amherst, MA 01003 USA
[2] Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
[3] Univ Connecticut, Dept Chem, Storrs, CT 06269 USA
[4] Brookhaven Natl Lab, Dept Environm Sci, Upton, NY 11973 USA
[5] Brookhaven Natl Lab, NSLS, Upton, NY 11973 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2390630
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Recent studies in microwave chemistry have proven many enhancements in reaction rates and selectivities. Most dramatic are several zeolite syntheses where over an order of magnitude more rapid rates are often, but not always, found. The reasons for these enhancements are not understood in part because in situ spectroscopies under microwave exposure are problematic. Thus, techniques have been slow to develop. This study describes a novel system with which x-ray scattering and Raman studies can be performed in situ during exposure to microwave radiation. The mechanisms and rates for the syntheses of zeolites or other microwave syntheses can be studied dynamically in this manner. A 2.45 GHz waveguide system operating in single pass or as a tuned cavity was developed through which an x-ray beam and/or a Raman laser could probe a synthesis solution and the appropriate scattering are studied. The X10A beamline at Brookhaven National Synchrotron Light Source was used for these studies. (c) 2006 American Institute of Physics.
引用
收藏
页数:10
相关论文
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