Precession electron diffraction using a digital sampling method

被引：20

作者：

Zhang, Daliang ^{[1
,2
]}

Gruner, Daniel ^{[1
]}

Oleynikov, Peter ^{[1
]}

Wan, Wei ^{[1
]}

Hovmoller, Sven ^{[1
]}

Zou, Xiaodong ^{[1
]}

机构：

[1] Stockholm Univ, Arrhenius Lab, Dept Mat & Environm Chem, Berzelii Ctr EXSELENT Porous Mat, SE-10691 Stockholm, Sweden

[2] Jilin Univ, State Key Lab Inorgan Synth & Preparat Chem, Changchun 130012, Peoples R China

来源：

ULTRAMICROSCOPY | 2010年 / 111卷 / 01期

基金：

瑞典研究理事会;

关键词：

Precession electron diffraction; Crystallography; Data processing; Crystal structure; TEM control; Lorentz correction; AB-INITIO DETERMINATION; SYSTEM; BEAM; MICRODIFFRACTION; IDENTIFICATION; INTENSITIES; TOMOGRAPHY; MICROSCOPY;

D O I：

10.1016/j.ultramic.2010.09.008

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A software-based method for collecting precession electron diffraction (PED) patterns is described. The PED patterns are obtained on a computer controlled transmission electron microscope. A series of electron diffraction (ED) patterns are collected as still ED frames at equal intervals, while the electron beam is precessed by one period (360 degrees) around the optical axis. A PED pattern is obtained by combining the different ED frames, which resembles the sampling of a conventional PED pattern. Since intermediate ED frames are collected, it is possible to perform different post-processing strategies on the ED data. This can be used for geometric corrections to obtain accurate integrated intensities. The alignments and data collection are fully automated and controlled by software. The data quality is comparable to what can be achieved using specialized hardware for precession. The PED data can be used for structure solution and refinement with reasonably good R-values. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：47 / 55

页数：9

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