Microstructure, domain structures and ferroelectric properties in (Pb0.8,La0.1,Ca0.1)TiO3/Pb(Zr0.2,Ti0.8)O3 bilayered thin film

被引：2

作者：

Zhu, Jiliang ^{[2
]}

Zhu, Xiaohong ^{[1
]}

Zeng, Huizhong ^{[3
]}

Jiang, Meng ^{[2
]}

Li, Xuhai ^{[2
]}

Zhu, Jianguo ^{[2
]}

Xiao, Dingquan ^{[2
]}

Li, Yanrong ^{[3
]}

机构：

[1] MINATEC, LETI, CEA, F-38054 Grenoble 9, France

[2] Sichuan Univ, Coll Mat Sci & Engn, Chengdu 610064, Peoples R China

[3] Univ Elect Sci & Technol China, Sch Microelect & Solid State Elect, Chengdu 610054, Peoples R China

来源：

THIN SOLID FILMS | 2009年 / 518卷 / 01期

关键词：

PLCT/PZT bilayered thin film; RF magnetron sputtering; Microstructure; Domain structure; Ferroelectric properties; EPITAXIAL BATIO3/SRTIO3 SUPERLATTICES; POLARIZATION; RECONSTRUCTION; ENHANCEMENT; DYNAMICS; PHYSICS;

D O I：

10.1016/j.tsf.2009.05.062

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ferroelectric (Pb-0.8,La-0.1,Ca-0.1)TiO3/Pb(Zr-0.2,Ti-0.8)O-3 (PLCT/PZT) bilayered thin film was prepared on Pt(111)/Ti/SiO2/Si(100) substrate by RF magnetron sputtering technique. Pure perovskite crystalline phase, determined by X-ray diffraction, was formed in the PLCT/PZT bilayer. The bilayered film exhibited a very dense and smooth surface morphology with a uniform grain size distribution. The ferroelectric domain structures were investigated by a combination of vertical and lateral piezoresponse force microscopy (VPFM and LPFM. respectively). It is demonstrated by both VPFM and LPFM observations that out-of-plane and in-plane lamellar ferroelectric domains coexist in the bilayered thin film. The PLCT/PZT bilayered film possesses good ferroelectric properties with relatively high spontaneous polarization (2P(s), = 82 mu C/cm(2)) and remnant polarization (2P(s), = 26.2 mu C/cm(2)). (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：392 / 395

页数：4

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