Testing Methods for Detecting Stuck-open Power Switches in Coarse-Grain MTCMOS Designs

被引：4

作者：

Mu, Szu-Pang ^{[1
]}

Wang, Yi-Ming ^{[1
]}

Yang, Hao-Yu ^{[1
]}

Chao, Mango C. -T. ^{[1
]}

Chen, Shi-Hao ^{[2
]}

Tseng, Chih-Mou ^{[2
]}

Tsai, Tsung-Ying ^{[2
]}

机构：

[1] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan

[2] Global Unichip Corp, Hsinchu, Taiwan

来源：

2010 IEEE AND ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD) | 2010年

关键词：

D O I：

10.1109/ICCAD.2010.5654118

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switches. In this paper, we study the usage of coarse-grain MTCMOS power switches for both logic circuits and SRAMs, and then propose corresponding methods of testing stuck-open power switches for each of them. For logic circuits, a specialized ATPG framework is proposed to generate a longest possible robust test while creating as many effective transitions in the switch-centered region as possible. For SRAMs, a novel test algorithm is proposed to exercise the worst-case power consumption and performance when stuck-open power switches exist. The experimental results based on an industrial MTCMOS technology demonstrate the advantage of our proposed testing methods on detecting stuck-open power switches for both logic circuits and SRAMs, when compared to conventional testing methods.

引用

页码：155 / 161

页数：7