Radiation-induced defects in GaN

被引:6
作者
Son, N. T. [1 ]
Hemmingsson, C. G. [1 ]
Morishita, N. [2 ]
Ohshima, T. [2 ]
Paskova, T. [3 ]
Evans, K. R. [3 ]
Usui, A. [4 ]
Isoya, J. [5 ]
Monemar, B. [1 ]
Janzen, E. [1 ]
机构
[1] Linkoping Univ, Dept Phys Chem & Biol, SE-58183 Linkoping, Sweden
[2] Japan Atom Energy Agcy, Takasaki, Gunma 3701292, Japan
[3] Kyma Technol Inc, Raleigh, NC 27617 USA
[4] Furukawa Co Ltd, R&D Div, Tsukuba, Ibaraki 3050856, Japan
[5] Univ Tsukuba, Grad Sch Lib Informat & Media Studies, Tsukuba, Ibaraki 3058550, Japan
关键词
IDENTIFICATION; LUMINESCENCE; IMPURITIES; VACANCIES; CRYSTALS;
D O I
10.1088/0031-8949/2010/T141/014015
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Radiation-induced defects in n-type GaN irradiated by 2 MeV electrons at room temperature were studied by electron paramagnetic resonance (EPR). Four EPR spectra, labelled D1-D4, were observed in irradiated n-type GaN. The D1 spectrum is a broad line (similar to 10-12 mT in line width) with an isotropic g-value g similar to 2.03 and can be detected in all the studied samples in the temperature range of 4-300 K. The D2 centre has an electron spin S = 1/2 and shows a clear hyperfine structure due to interaction with three equivalent N-14. The g-values of the axial configuration are determined to be g(parallel to) = 2.001 and g(perpendicular to) = 1.999. On the basis of the observed hyperfine structure, formation conditions and annealing behaviour, the D2 defect was assigned to the gallium vacancy-oxygen pair in the negative charge state, (VGaON)(-).
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页数:4
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