Radiation-induced defects in GaN

被引:6
作者
Son, N. T. [1 ]
Hemmingsson, C. G. [1 ]
Morishita, N. [2 ]
Ohshima, T. [2 ]
Paskova, T. [3 ]
Evans, K. R. [3 ]
Usui, A. [4 ]
Isoya, J. [5 ]
Monemar, B. [1 ]
Janzen, E. [1 ]
机构
[1] Linkoping Univ, Dept Phys Chem & Biol, SE-58183 Linkoping, Sweden
[2] Japan Atom Energy Agcy, Takasaki, Gunma 3701292, Japan
[3] Kyma Technol Inc, Raleigh, NC 27617 USA
[4] Furukawa Co Ltd, R&D Div, Tsukuba, Ibaraki 3050856, Japan
[5] Univ Tsukuba, Grad Sch Lib Informat & Media Studies, Tsukuba, Ibaraki 3058550, Japan
关键词
IDENTIFICATION; LUMINESCENCE; IMPURITIES; VACANCIES; CRYSTALS;
D O I
10.1088/0031-8949/2010/T141/014015
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Radiation-induced defects in n-type GaN irradiated by 2 MeV electrons at room temperature were studied by electron paramagnetic resonance (EPR). Four EPR spectra, labelled D1-D4, were observed in irradiated n-type GaN. The D1 spectrum is a broad line (similar to 10-12 mT in line width) with an isotropic g-value g similar to 2.03 and can be detected in all the studied samples in the temperature range of 4-300 K. The D2 centre has an electron spin S = 1/2 and shows a clear hyperfine structure due to interaction with three equivalent N-14. The g-values of the axial configuration are determined to be g(parallel to) = 2.001 and g(perpendicular to) = 1.999. On the basis of the observed hyperfine structure, formation conditions and annealing behaviour, the D2 defect was assigned to the gallium vacancy-oxygen pair in the negative charge state, (VGaON)(-).
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页数:4
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共 18 条
  • [1] Optically-detected magnetic resonance of spin-paired complexes emitting in the 2.3 eV spectral region in Mg-doped GaN
    Aliev, G. N.
    Zeng, S.
    Bingham, S. J.
    Wolverson, D.
    Davies, J. J.
    Wang, T.
    Parbrook, P. J.
    [J]. PHYSICAL REVIEW B, 2006, 74 (23)
  • [2] Identification of manganese trace impurity in GaN crystals by electron paramagnetic resonance
    Baranov, PG
    Ilyin, IV
    Mokhov, EN
    Roenkov, AD
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (12) : 1843 - 1846
  • [3] Identification of iron transition group trace impurities in GaN bulk crystals by electron paramagnetic resonance
    Baranov, PG
    Ilyin, IV
    Mokhov, EN
    [J]. SOLID STATE COMMUNICATIONS, 1997, 101 (08) : 611 - 615
  • [4] g values of effective mass donors in AlxGa1-xN alloys -: art. no. 165204
    Bayerl, MW
    Brandt, MS
    Graf, T
    Ambacher, O
    Majewski, JA
    Stutzmann, M
    As, DJ
    Lischka, K
    [J]. PHYSICAL REVIEW B, 2001, 63 (16)
  • [5] ELECTRON-SPIN-RESONANCE STUDIES OF DONORS IN WURTZITE GAN
    CARLOS, WE
    FREITAS, JA
    KHAN, MA
    OLSON, DT
    KUZNIA, JN
    [J]. PHYSICAL REVIEW B, 1993, 48 (24): : 17878 - 17884
  • [6] Intrinsic defects in GaN. I. Ga sublattice defects observed by optical detection of electron paramagnetic resonance
    Chow, KH
    Vlasenko, LS
    Johannesen, P
    Bozdog, C
    Watkins, GD
    Usui, A
    Sunakawa, H
    Sasaoka, C
    Mizuta, M
    [J]. PHYSICAL REVIEW B, 2004, 69 (04):
  • [7] Detection of interstitial Ga in GaN
    Chow, KH
    Watkins, GD
    Usui, A
    Mizuta, M
    [J]. PHYSICAL REVIEW LETTERS, 2000, 85 (13) : 2761 - 2764
  • [8] Optically detected magnetic resonance of paired defects in as-grown magnesium-doped GaN
    Davies, JJ
    Aliev, GN
    Bingham, SJ
    Wolverson, D
    Stepanov, S
    Yavich, B
    Wang, WN
    [J]. PHYSICAL REVIEW B, 2003, 67 (03):
  • [9] Magnetic resonance studies of Mg-doped GaN epitaxial layers grown by organometallic chemical vapor deposition
    Glaser, ER
    Carlos, WE
    Braga, GCB
    Freitas, JA
    Moore, WJ
    Shanabrook, BV
    Henry, RL
    Wickenden, AE
    Koleske, DD
    Obloh, H
    Kozodoy, P
    DenBaars, SP
    Mishra, UK
    [J]. PHYSICAL REVIEW B, 2002, 65 (08) : 1 - 10
  • [10] Direct evidence of impurity decoration of Ga vacancies in GaN from positron annihilation spectroscopy
    Hautakangas, S.
    Makkonen, I.
    Ranki, V.
    Puska, J.
    Saarinen, K.
    Xu, X.
    Look, D. C.
    [J]. PHYSICAL REVIEW B, 2006, 73 (19):