A technique for electromagnetic interference measurements on instruments

被引：4
作者：
Angrisani, L [1 ]
Pietrosanto, A [1 ]
机构：
[1] Univ Salerno, Dept Comp Sci & Elect Engn, I-84084 Fisciano, SA, Italy
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1998年 / 47卷 / 04期
关键词：
electromagnetic compatibility; electromagnetic interference; digital system testing; IEC standards; VXI;
D O I：
10.1109/19.744644
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The aim of this paper is to highlight the problems that arise when the immunity of measurement instruments to power line voltage disturbances has to be evaluated. The lack of an international product standard puts at the user's disposal only some basic standards which, in giving only general criteria for test result classification, make it difficult to choose suitable acceptance criteria and, consequently, to plan a proper set of tests, especially for very complex instruments. After an introduction on the state of art of electromagnetic compatibility (EMC) international standards, a measurement technique adopted by the authors to evaluate the immunity of complex instruments to conducted disturbances is presented. Finally, experimental tests carried out on VXI instruments are given and discussed exhaustively.
引用
收藏
页码：925 / 929
页数：5
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