Electrical properties of lightly Ga-doped ZnO nanowires

被引:9
作者
Alagha, S. [1 ]
Heedt, S. [2 ,3 ]
Vakulov, D. [2 ,3 ]
Mohammadbeigi, F. [1 ]
Kumar, E. Senthil [1 ,5 ]
Schaepers, Th [2 ,3 ]
Isheim, D. [4 ]
Watkins, S. P. [1 ]
Kavanagh, K. L. [1 ]
机构
[1] Simon Fraser Univ, Phys Dept, Burnaby, BC V5A 1S6, Canada
[2] Forschungszentrum Julich, Peter Grunberg Inst PGI 9, D-52425 Julich, Germany
[3] Forschungszentrum Julich, JARA Fundamentals Future Informat Technol, D-52425 Julich, Germany
[4] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[5] SRM Univ, Dept Phys, R-4,13th Floor,Cent Lib Bldg, Madras, Tamil Nadu, India
基金
加拿大自然科学与工程研究理事会;
关键词
nanowire; ZnO; Ga-doping; MOCVD; electrical transport; atom-probe tomography; FIELD-EFFECT TRANSISTORS; ATOM-PROBE TOMOGRAPHY; TRANSPORT-PROPERTIES; NANOSTRUCTURES; DONOR; NANOCONTACTS; FABRICATION; SILICON; GROWTH; ARRAYS;
D O I
10.1088/1361-6641/aa91ef
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We investigated the growth, crystal structure, elemental composition and electrical transport characteristics of ZnO nanowires, a promising candidate for optoelectronic applications in the UV-range. Nominally-undoped and Ga-doped ZnO nanowires were grown by metal-organic chemical vapor deposition. Photoluminescence measurements confirmed the incorporation of Ga via donor-bound exciton emission. With atom-probe tomography we estimated an upper limit of the Ga impurity concentration (10(18) cm(-3)). We studied the electrical transport characteristics of these nanowires with a W-nanoprobe technique inside a scanning electron microscope and with lithographically-defined contacts allowing back-gated measurements. An increase in apparent resistivity by two orders of magnitude with decreasing radius was measured with both techniques with a much larger distribution width for the nanoprobe method. A drop in the effective carrier concentration and mobility was found with decreasing radius which can be attributed to carrier depletion and enhanced scattering due to surface states. Little evidence of a change in resistivity was observed with Ga doping, which indicates that the concentration of native or background dopants is higher than the Ga doping concentration.
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页数:12
相关论文
共 51 条
[1]   Space-charge-limited current in nanowires [J].
Alagha, S. ;
Shik, A. ;
Ruda, H. E. ;
Saveliev, I. ;
Kavanagh, K. L. ;
Watkins, S. P. .
JOURNAL OF APPLIED PHYSICS, 2017, 121 (17)
[2]   Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters [J].
Amirifar, Nooshin ;
Larde, Rodrigue ;
Talbot, Etienne ;
Pareige, Philippe ;
Rigutti, Lorenzo ;
Mancini, Lorenzo ;
Houard, Jonathan ;
Castro, Celia ;
Sallet, Vincent ;
Zehani, Emir ;
Hassani, Said ;
Sartel, Corine ;
Ziani, Ahmed ;
Portier, Xavier .
JOURNAL OF APPLIED PHYSICS, 2015, 118 (21)
[3]   Doping Asymmetry Problem in ZnO: Current Status and Outlook [J].
Avrutin, Vitaliy ;
Silversmith, Donald J. ;
Morkoc, Hadis .
PROCEEDINGS OF THE IEEE, 2010, 98 (07) :1269-1280
[4]   Transparent conductive Ga-doped ZnO films fabricated by MOCVD [J].
Behrends, Arne ;
Wagner, Alexander ;
Al-Suleiman, Mohamed Aid Mansur ;
Lugauer, Hans-Juergen ;
Strassburg, Martin ;
Walter, Robert ;
Weimar, Andreas ;
Waag, Andreas ;
Bakin, Andrey .
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2012, 209 (04) :708-713
[5]   Photoluminescence study of ZnO nanostructures grown on silicon by MOCVD [J].
Biethan, J. -P. ;
Sirkeli, V. P. ;
Considine, L. ;
Nedeoglo, D. D. ;
Pavlidis, D. ;
Hartnagel, H. L. .
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 2012, 177 (08) :594-599
[6]  
Björk MT, 2009, NAT NANOTECHNOL, V4, P103, DOI [10.1038/NNANO.2008.400, 10.1038/nnano.2008.400]
[7]   Spatially-resolved cathodoluminescence spectroscopy of ZnO defects [J].
Brillson, L. J. ;
Ruane, W. T. ;
Gao, H. ;
Zhang, Y. ;
Luo, J. ;
von Wenckstern, H. ;
Grundmann, M. .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2017, 57 :197-209
[8]   Interplay of native point defects with ZnO Schottky barriers and doping [J].
Brillson, Leonard J. ;
Dong, Yufeng ;
Tuomisto, Filip ;
Svensson, Bengt G. ;
Kuznetsov, Andrei Yu. ;
Doutt, Daniel ;
Mosbacker, H. Lee ;
Cantwell, Gene ;
Zhang, Jizhi ;
Song, Jin Joo ;
Fang, Z. -Q. ;
Look, David C. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2012, 30 (05)
[9]   ZnO Schottky barriers and Ohmic contacts [J].
Brillson, Leonard J. ;
Lu, Yicheng .
JOURNAL OF APPLIED PHYSICS, 2011, 109 (12)
[10]   Ionization energy of donor and acceptor impurities in semiconductor nanowires: Importance of dielectric confinement [J].
Diarra, Mamadou ;
Niquet, Yann-Michel ;
Delerue, Christophe ;
Allan, Guy .
PHYSICAL REVIEW B, 2007, 75 (04)