Optical autofocus for high resolution laser photoplotting

被引:1
作者
Alonso, J [1 ]
Crespo, D [1 ]
Jiménez, I [1 ]
Bernabeu, E [1 ]
机构
[1] Univ Complutense Madrid, Dept Opt, Fac Ciencias Fis, E-28040 Madrid, Spain
来源
PHOTONIC MATERIALS, DEVICES, AND APPLICATIONS, PTS 1 AND 2 | 2005年 / 5840卷
关键词
optical autofocus; laser photoplotter; mask writing;
D O I
10.1117/12.628138
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
An all optical autofocus has been designed and tested for tight line width control in a high NA laser photoplotter system. The laser system is based in a GaN semiconductor laser with power 30 mW and wavelength 405 nm. The advantage of using this laser, despite the relatively long wavenlength, is compactness and easy for high frequency modulation. The autofocus system is based in a secondary 635 nm GaAlAs laser without need for wavelength, neither power stabilization. The two beams are delivered coaxially through the focusing lens by means of a dichroic beamsplitter. Focusing lens need no correction for chromatic aberration, as this is compensed by appropriate autofocus beam divergence. After reflection in the sample, the autofocus beam is separated from the returning writing beam and then guided to a collimation sensor, in which defocus of about 1/20 of the Rayleigh range of the writing beam can be detected and compensated by an analogue PID electronic control. Stable linewidth within 5% is achieved with different numerical aperture focusing lenses.
引用
收藏
页码:871 / 878
页数:8
相关论文
共 15 条
[1]  
Andriani P., 1989, Applied Physics Communications, V9, P203
[2]  
Becker H, 1997, J MOD OPTIC, V44, P1715, DOI 10.1080/09500349708230771
[3]   A 3D optical profilometer using a compact disc reading head [J].
Ehrmann, K ;
Ho, A ;
Schindhelm, K .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (08) :1259-1265
[4]   Development of a low-cost autofocusing probe for profile measurement [J].
Fan, KC ;
Chu, CL ;
Mou, JI .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (12) :2137-2146
[5]   A NEW PRECISE OPTICAL AUTOFOCUS SYSTEM [J].
FEIN, ME ;
KELDERMAN, HF ;
NEUKERMANS, AP ;
LOH, AE ;
WOLZE, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :2017-2022
[6]  
HARANO M, 1998, DEV LASER BEAM WRITI, P199
[7]  
JIHUAZHANG, 1998, APPL OPTICS, V37, P2691
[8]  
KISOOPARK, 1993, KOREAN APPL PHYS, V6, P1
[9]   Autofocus system for microscope [J].
Li, QX ;
Bai, LF ;
Xue, SF ;
Chen, LY .
OPTICAL ENGINEERING, 2002, 41 (06) :1289-1294
[10]  
LIAUW L, 1987, SPIE, V772, P232