Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

被引：5

作者：

Gao, Xuan ^{[1
,2
]}

Casa, Diego ^{[3
]}

Kim, Jungho ^{[3
]}

Gog, Thomas ^{[3
]}

Li, Chengyang ^{[1
,4
]}

Burns, Clement ^{[1
]}

机构：

[1] Western Michigan Univ, Dept Phys, Kalamazoo, MI 49008 USA

[2] Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China

[3] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[4] South Univ Sci & Technol China, Dept Phys, Shenzhen 518055, Peoples R China

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 08期

关键词：

CRYSTAL ANALYZERS; DIFFRACTION; EXCITATIONS; BRAGG;

D O I：

10.1063/1.4959566

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals. Published by AIP Publishing.

引用

页数：7

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