Correlation of quantitative light-induced fluorescence and optical coherence tomography applied for detection and quantification of early dental caries

被引:96
作者
Amaechi, BT
Podoleanu, A
Higham, SM
Jackson, DA
机构
[1] Univ Texas, Hlth Sci Ctr, Dept Community Dent, Cariol Grp, San Antonio, TX 78229 USA
[2] Univ Kent, Sch Phys Sci, Dept Phys, Appl Opt Grp, Canterbury, Kent, England
[3] Univ Liverpool, Dept Clin Dent Sci, Cariol Grp, Liverpool L69 3BX, Merseyside, England
关键词
optical coherence tomography; low coherence interferometry; quantitative light-induced fluorescence; confocal imaging; dental imaging; caries diagnosis; dental caries;
D O I
10.1117/1.1606685
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
Fluorescence loss in enamel following demineralization has been correlated with the amount of mineral lost during the demineralization. The correlation between fluorescence loss measured by quantitative light-induced fluorescence (QLF) and the reflectivity loss measured by a versatile en face optical coherence tomography (OCT) system was investigated in a demineralization process to produce artificial dental caries. We used an OCT system that can collect A-scans (reflectivity versus depth), B-scans (longitudinal images), and C-scans (en face images). The power to the sample was 250 muW, the wavelength lambda = 850 nm, and the depth resolution in air 16 mum. A-scans, which show the profile of the reflectivity versus the depth of penetration into the tooth tissue, were used for quantitative analysis of the reflectivity loss. The results have shown that both the fluorescence radiance and reflectivity of the enamel decrease with increasing demineralization time A linear correlation was observed between the percentage of fluorescence loss measured by QLF and the percentage of reflectivity loss measured by OCT. It was concluded that the decrease in reflectivity of the enamel during demineralization, measured by OCT, could be related to the amount of mineral lost during the demineralization process. (C) 2003 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:642 / 647
页数:6
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