Film stoichiometry and gas dissociation kinetics in hot-wire chemical vapor deposition of a-SiGe:H

被引:5
作者
Doyle, James R. [1 ,2 ]
Xu, Yueqin [1 ]
Reedy, Robert [1 ]
Branz, Howard M. [1 ]
Mahan, A. Harv [1 ]
机构
[1] Natl Renewable Energy Lab, Golden, CO 80231 USA
[2] Macalester Coll, Dept Phys & Astron, St Paul, MN 55105 USA
基金
美国国家科学基金会;
关键词
hot-wire deposition; amorphous silicon germanium alloys;
D O I
10.1016/j.tsf.2007.06.189
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The gas phase dissociation rates of silane and germane are measured for HWCVD on a tantalum filament and compared to the a-SiGe:H film composition. The Ge from dissociated germane is converted entirely into film on the substrate and chamber walls. Approximately 85% of the Si from the dissociated silane is converted into film, with the rest incorporated into the filament. The dissociation rate per unit partial pressure of germane is 2-3 times that of silane. The pressure dependence of feed gas depletion rates suggests that the dissociation on the filament is rate limited by filament reactive site availability. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:526 / 528
页数:3
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