Effects of hydrogen during molecular beam epitaxy of GaN

被引:2
|
作者
Dong, Y [1 ]
Feenstra, RM [1 ]
机构
[1] Carnegie Mellon Univ, Dept Phys, Pittsburgh, PA 15213 USA
关键词
D O I
10.1002/pssc.200461464
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We study the effect of introducing hydrogen gas through the RF plasma source during plasma-assisted molecular beam epitaxy of GaN(0001). The well-known smooth-to-rough transition that occurs for this surface as a function of decreasing Ga flux in the absence of H is found to persist even with H present. But, the critical Ga flux for this transition is increased by the presence of H, and for sufficiently high H pressure a new 2 x 2 surface structure that is believed to be H-terminated is observed. Under Ga-rich conditions, the presence of hydrogen is found to induce step bunching on the surface, from which we argue that H selectively bonds to surface step and/or kink sites. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2183 / 2186
页数:4
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