Er-doped silica-based waveguides prepared by different techniques: RF-sputtering, sol-gel and ion-exchange

被引:39
作者
Righini, GC [1 ]
Pelli, S
Ferrari, M
Armellini, C
Zampedri, L
Tosello, C
Ronchin, S
Rolli, R
Moser, E
Montagna, M
Chiasera, A
Ribeiro, SJL
机构
[1] CNR, IROE, Optoelect & Photon Dept, I-50127 Florence, Italy
[2] CNR, CeFSA, Ctr Fis Stati Aggregati, I-38050 Povo, Italy
[3] Univ Trent, Dipartimento Fis, I-38050 Povo, Italy
[4] Univ Trent, INFM, I-38050 Povo, Italy
[5] UNESP, Inst Quim, BR-14801970 Arraquara, Brazil
关键词
dip-coating; erbium; ion-exchange; luminescence spectroscopy; optical amplification; optical waveguides; Raman spectroscopy; RF-sputtering; silicate glasses; upconversion;
D O I
10.1023/A:1021338906917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Erbium-activated silica-based planar waveguides were prepared by three different technological routes: RF-sputtering, sol-gel and ion exchange. Various parameters of preparation were varied in order to optimize the waveguides for operation in the NIR region. Particular attention was devoted to the minimization of the losses and the increase of the luminescence efficiency of the metastable I-4(13/2) state of the Er3+ ion. Waveguide properties were determined by m-line spectroscopy and loss measurements. Waveguide Raman and luminescence spectroscopy were used to obtain information about the structure of the prepared films and about the dynamical processes related to the luminescence of the Er3+ ions.
引用
收藏
页码:1151 / 1166
页数:16
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