The Optical Constants of Thin Films Calculated from Reflectance and Transmittance Measurements

被引：0
|
作者：
Chiang, Donyau [1 ]
Chu, Cheng Hung [2 ]
Chiang, Hai-Pang [2 ]
Tsai, Din Ping [1 ,3 ]
机构：
[1] Instrument Technol Res Ctr, Natl Appl Res Labs, Hsinchu 300, Taiwan
[2] Natl Taiwan Ocean Univ, Inst Optoelectron Sci, Chilung 202, Taiwan
[3] Natl Taipei Univ Technol, Dept Phys, Taipei 106, Taiwan
来源：
2009 OPTICAL DATA STORAGE TOPICAL MEETING | 2009年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.
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页码：40 / +
页数：2
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