共 24 条
Baseline correction for infrared spectra using adaptive smoothness parameter penalized least squares method
被引:60
作者:

Zhang, Feng
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机构:
Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Tang, Xiaojun
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Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Tong, Angxin
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Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Wang, Bin
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Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Wang, Jingwei
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Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Lv, Yangyu
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Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Tang, Chunrui
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h-index: 0
机构:
CCTEG Chongqing Engn Co Ltd, Chongqing, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

Wang, Jie
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机构:
CCTEG Chongqing Engn Co Ltd, Chongqing, Peoples R China Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China
机构:
[1] Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China
[2] CCTEG Chongqing Engn Co Ltd, Chongqing, Peoples R China
关键词:
Baseline correction;
infrared spectra;
penalized least squares;
WAVELET TRANSFORM;
AUTOMATED-METHOD;
POINTS;
D O I:
10.1080/00387010.2020.1730908
中图分类号:
O433 [光谱学];
学科分类号:
0703 ;
070302 ;
摘要:
Baseline wander is a common problem in analysis with Fourier Transform Infrared Spectrometer (FTIR). And it is necessary to correct baseline drift for further quantitative and qualitative analysis. Several baseline correction algorithms based on penalized least squares have been proposed. However, these methods are usually used in noise-free or low-noise environments. In this paper, a novel algorithm named adaptive smoothness parameter penalized least squares was proposed. The smoothness parameters were set by user at first. Then, the smoothness parameter was updated iteratively according to the difference between the original spectrum and fitted baseline. When the iteration reaches the termination condition, the fitted baseline can be obtained. In the end of the paper, experimental results on simulated spectra and measured infrared spectra of methane were given. The simulated spectra results demonstrate that the proposed method has better performance than existing methods, especially when the spectra contain high noise. The results of infrared spectra confirm that the proposed method has good performance and can be applied to correct spectral baseline accurately.
引用
收藏
页码:222 / 233
页数:12
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