Index of refraction of shock-released materials

被引：12

作者：

Fratanduono, D. E. ^{[1
,2
,5
]}

Eggert, J. H. ^{[1
]}

Boehly, T. R. ^{[5
]}

Barrios, M. A. ^{[3
,5
]}

Meyerhofer, D. D. ^{[2
,3
,5
]}

Jensen, B. J. ^{[4
]}

Collins, G. W. ^{[1
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[2] Univ Rochester, Dept Mech Engn, Rochester, NY 14627 USA

[3] Univ Rochester, Dept Phys & Astron, Rochester, NY 14627 USA

[4] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[5] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 110卷 / 08期

关键词：

INTERFEROMETER; COMPRESSION; SAPPHIRE;

D O I：

10.1063/1.3650258

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new technique to measure the refractive index of shocked materials is reported. The arrival of a transparent shock at the free surface of an optical window generates a discontinuity in the observed interferometry record. In this work, we show that the magnitude of that discontinuity is simply defined by the shock velocity, the shocked refractive, and the free-surface velocity. This new technique, to measure the high-pressure refractive index of a transparent material, is demonstrated. (C) 2011 American Institute of Physics. [doi:10.1063/1.3650258]

引用

页数：5

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