Co/Pt multilayer based magnetic tunnel junctions using perpendicular magnetic anisotropy

被引:102
作者
Park, Jeong-Heon [1 ]
Park, Chando [2 ]
Jeong, Taehee [3 ]
Moneck, Matthew T. [3 ]
Nufer, Noel T. [1 ]
Zhu, Jian-Gang [3 ]
机构
[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
[2] Western Digital Corp, Fremont, CA 94539 USA
[3] Carnegie Mellon Univ, Dept Elect & Comp Engn, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
Cobalt compounds - Magnetic anisotropy - Magnetic devices - Multilayers;
D O I
10.1063/1.2838754
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetic tunnel junctions that utilize perpendicular magnetic anisotropy have attracted growing attention due to their potential for higher storage densities in future high capacity magnetic memory applications. In this study, we present an experimental demonstration of magnetic tunnel junctions composed of perpendicularly magnetized Co/Pt multilayer electrodes and an AlOx tunnel barrier. The emphasis has been on how to maximize the thickness of the Co layers adjacent to the tunnel barrier while still magnetized perpendicularly for possible spin torque utilization in future applications. It is found that the thickness ratio between the Co and Pt layers and the number of bilayers were significant parameters to customize the magnetic properties. The difference between the switching fields of the soft and the hard layers can be adjusted by the number of repeats of the Co/Pt bilayers. The measured hysteresis shows virtually zero exchange coupling between the two layers through the tunnel barrier. Measured tunneling magnetoresistance ratio of the fabricated submicron-size tunnel junctions ranges from 10% to 15% at room temperature.
引用
收藏
页数:3
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