共 5 条
Patterning of Two-Level Topographic Cues for Observation of Competitive Guidance of Cell Alignment
被引:19
|作者:
Zhou, Xiongtu
[1
,2
]
Hu, Jie
[1
]
Li, Junjun
[1
]
Shi, Jian
[1
]
Chen, Yong
[1
,3
]
机构:
[1] CNRS ENS UPMC UMR 8640, Ecole Normale Super, F-75231 Paris, France
[2] Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China
[3] Kyoto Univ, Inst Integrated Cell Mat Sci, Kyoto 6068507, Japan
关键词:
cell alignment;
cell-substrate interaction;
two-level topographic cues;
microgroove;
SCAFFOLDS;
BEHAVIOR;
ORIENTATION;
NANOSCALE;
MIGRATION;
DYNAMICS;
SURFACES;
D O I:
10.1021/am301237j
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Cells display contact guidance when cultured on topographical cues. By combining standard photolithography, nanoimprint lithography, and soft lithography, we produced sophisticated patterns on two levels, including crossing microgrooves with different depth/spacing and microgrooves with superimposed submicrometer features. The results show that for narrowly spaced microgrooves, the contact guidance is more significant to the change of groove depth than to other geometry parameters. For crossing microgrooves, the shallow grooves take over the influence on cell alignment when the deeper grooves are well separated. Finally, the superimposed submicrometer features on the groove ridges decrease the efficiency of the contact guidance of microgrooves, due to increased adhesion of cells on patterned surfaces.
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页码:3888 / 3892
页数:5
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