Visualization of Ultrafast Electron Dynamics Using Time-Resolved Photoemission Electron Microscopy

被引：1
作者：
Fukumoto, K. [1 ,2 ]
Yamada, Y. [1 ]
Matsuki, T. [1 ]
Onda, K. [1 ,3 ]
Noguchi, T. [1 ]
Mizokuchi, R. [1 ]
Oda, S. [1 ]
Koshihara, S. [1 ,2 ]
机构：
[1] Tokyo Inst Technol, Meguro Ku, Tokyo 1528551, Japan
[2] JST CREST, Kawaguchi, Saitama 3320012, Japan
[3] JST PRESTO, Kawaguchi, Saitama 3320012, Japan
来源：
ULTRAFAST PHENOMENA XIX | 2015年 / 162卷
关键词：
D O I：
10.1007/978-3-319-13242-6_82
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We constructed a TR-PEEM which can directly image the photo-generated electron dynamics in semiconductor on nm and fs scales. Carrier transport properties relating to device performance, carrier lifetime, drift velocity and mobility, are investigated.
引用
收藏
页码：337 / 340
页数：4
相关论文
共 50 条
[31]   Femtosecond time-resolved electron microscopy [J].
Yang, Jinfeng ;
Yoshida, Yoichi ;
Shibata, Hiromi .
IEEJ Transactions on Electronics, Information and Systems, 2014, 134 (04) :515-520
[32]   Megavolt electron beams for ultrafast time-resolved electron diffraction [J].
Rudakov, F. M. ;
Hastings, J. B. ;
Dowell, D. H. ;
Schmerge, J. F. ;
Weber, P. M. .
Shock Compression of Condensed Matter - 2005, Pts 1 and 2, 2006, 845 :1287-1292
[33]   Ultrafast time-resolved electron diffraction with megavolt electron beams [J].
Hastings, J. B. ;
Rudakov, F. M. ;
Dowell, D. H. ;
Schmerge, J. F. ;
Cardoza, J. D. ;
Castro, J. M. ;
Gierman, S. M. ;
Loos, H. ;
Weber, P. M. .
APPLIED PHYSICS LETTERS, 2006, 89 (18)
[34]   Femtosecond Time-Resolved Electron Microscopy [J].
Yang, Jinfeng ;
Yoshida, Yoichi ;
Shibata, Hiromi .
ELECTRONICS AND COMMUNICATIONS IN JAPAN, 2015, 98 (11) :50-57
[35]   Time-resolved Lorentz microscopy study of vortex dynamics using electron counting and electron correlation spectroscopy [J].
Osakabe, N ;
Kasai, H ;
Tonomura, A .
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION, 1998, :565-566
[36]   Unraveling Spatially Heterogeneous Ultrafast Carrier Dynamics of Single-Layer WSe2 by Femtosecond Time-Resolved Photoemission Electron Microscopy [J].
Wang, Lin ;
Xu, Ce ;
Li, Ming-Yang ;
Li, Lain-Jong ;
Loh, Zhi-Heng .
NANO LETTERS, 2018, 18 (08) :5172-5178
[37]   Ultrafast Charge Transfer and Recombination Dynamics in Monolayer-Multilayer WSe2 Junctions Revealed by Time-Resolved Photoemission Electron Microscopy [J].
Xu, Ce ;
Barden, Natalie ;
Alexeev, Evgeny M. ;
Wang, Xiaoli ;
Long, Run ;
Cadore, Alisson R. ;
Paradisanos, Ioannis ;
Ott, Anna K. ;
Soavi, Giancarlo ;
Tongay, Sefaattin ;
Cerullo, Giulio ;
Ferrari, Andrea C. ;
Prezhdo, Oleg V. ;
Loh, Zhi-Heng .
ACS NANO, 2024, 18 (03) :1931-1947
[38]   Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy [J].
Fukumoto, Keiki ;
Yamada, Yuki ;
Onda, Ken ;
Koshihara, Shin-ya .
APPLIED PHYSICS LETTERS, 2014, 104 (05)
[39]   Study of ultrafast processes in matter by means of time-resolved electron diffraction and microscopy [J].
Aseyev, Sergei ;
Mironov, Boris ;
Andreyev, Sergei ;
Kompanets, Victor ;
Ischenko, Anatolii ;
Kochikov, Igor' ;
Misochko, Oleg ;
Chekalin, Sergei ;
Ryabov, Evgenii .
XI INTERNATIONAL SYMPOSIUM ON PHOTON ECHO AND COHERENT SPECTROSCOPY (PECS-2017), 2017, 161
[40]   Time-Resolved Photoemission Electron Microscopy on a ZnO Surface Using an Extreme Ultraviolet Attosecond Pulse Pair [J].
Vogelsang, Jan ;
Wittenbecher, Lukas ;
Mikaelsson, Sara ;
Guo, Chen ;
Sytcevich, Ivan ;
Viotti, Anne-Lise ;
Arnold, Cord L. ;
L'Huillier, Anne ;
Mikkelsen, Anders .
ADVANCED PHYSICS RESEARCH, 2024, 3 (03)
12345