Development of infrared microspectroscopy instrumentation and applications

被引：0

作者：

Reffner, JA ^{[1
]}

机构：

[1] SensIR Technol, Danbury, CT 06810 USA

来源：

MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：39 / 40

页数：2

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