Performance of planar-waveguide external cavity laser for precision measurements

被引：95

作者：

Numata, Kenji ^{[1
,2
]}

Camp, Jordan ^{[2
]}

Krainak, Michael A. ^{[2
]}

Stolpner, Lew ^{[3
]}

机构：

[1] Univ Maryland, Dept Astron, College Pk, MD 20742 USA

[2] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

[3] Redfern Integrated Opt Inc, Santa Clara, CA 95054 USA

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 22期

关键词：

NOISE CHARACTERISTICS; INTENSITY NOISE; FIBER LASERS; DIODE-LASER; FREQUENCY; STABILIZATION; LISA;

D O I：

10.1364/OE.18.022781

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A 1542-nm planar-waveguide external cavity laser (PW-ECL) is shown to have a sufficiently low level of noise to be suitable for precision measurement applications. Its frequency noise and intensity noise was comparable or better than the non-planar ring oscillator (NPRO) and fiber laser between 0.1 mHz to 100 kHz. Controllability of the PW-ECL was demonstrated by stabilizing its frequency to acetylene ((C2H2)-C-13) at 10(-13) level of Allan deviation. The PW-ECL also has the advantage of the compactness of a standard butterfly package, low cost, and a simple design consisting of a semiconductor gain media coupled to a planar-waveguide Bragg reflector. (C) 2010 Optical Society of America

引用

页码：22781 / 22788

页数：8

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