Ronchi and Moire patterns for testing spherical and aspherical surfaces using deflectometry

被引:10
作者
Arriaga-Hernandez, J. A. [1 ]
Jaramillo-Nunez, A. [1 ]
机构
[1] Inst Nacl Astrofis Opt & Electr, Dept Opt, Luis Enrrique Erro 1, Puebla 72840, Mexico
关键词
D O I
10.1364/AO.57.009963
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The aim of this paper is to compare the Ronchi test and the Moire deflectometry applied to a new pattern. To do so, we used two Ronchi patterns (typical Ronchigrams) produced by two identical Ronchi rulings angularly displaced and placed close to the curvature radius of a mirror. The result obtained by superposing both Ronchigrams is our new pattern, a Moire pattern of the Ronchigram (Moire-Ronchigram). The Zernike aberration polynomial coefficients of the tridimensional wavefront for both mirrors are obtained as a result. We also compared the Zernike coefficients obtained for each of the mentioned techniques and we found that the results with less dispersion are those where Moire deflectometry was applied. Finally, as a confidence test for applying and testing the Moire-Ronchigram, we compare our results with Open Fringe, FringeXP, and APEX, using the root-mean-square and standard deviation values. (C) 2018 Optical Society of America
引用
收藏
页码:9963 / 9971
页数:9
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