Atomic force microscopy of gibbsite

被引：13

作者：

Lloyd, S

Thurgate, SM

Cornell, RM

Parkinson, GM

机构：

[1] Murdoch Univ, Sch Math & Phys Sci, Murdoch, WA 6150, Australia

[2] Curtin Univ Technol, Sch Appl Chem, Perth, WA 6845, Australia

[3] Alcoa Australia Ltd, Kwinana, WA 6167, Australia

来源：

APPLIED SURFACE SCIENCE | 1998年 / 135卷 / 1-4期

关键词：

gibbsite; atomic force microscopy; surface structure;

D O I：

10.1016/S0169-4332(98)00283-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic force microscopy has been used to image the surface structure of a range of gibbsite (AI(OH)(3)) crystals. A variety of microtopographies has been imaged on the (001) plane, and sub-nanometer detail has been observed on flat areas that is commensurate with the known bulk structure of the solid. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：178 / 182

页数：5

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AUDET DR, 1988, LIGHT METALS 1989, P21

[2]

Bennema P, 1976, IND CRYSTALLIZATION

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