Picosecond dynamics of low density excitons in GaAs quantum wells

被引:0
|
作者
Shum, K [1 ]
Alfano, RR [1 ]
Morkoc, H [1 ]
机构
[1] CUNY City Coll, Inst Ultrafast Spect & Laser, New York, NY 10031 USA
来源
ULTRAFAST PHENOMENA IN SEMICONDUCTORS II | 1998年 / 3277卷
关键词
low exciton density; picosecond time-resolved photoluminescence; GaAs quantum wells;
D O I
10.1117/12.306148
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Time-resolved photoluminescence (PL) measurements were performed on a multiple GaAs/AlGaAs quantum well structure. The rise and decay profiles of PL centered at the free exciton line and the impurity related excitonic-complex line were investigated as a function of temperature at a low excitation density (10(9) cm(-2)). This study provides new information on how excitons are captured by impurities and on the kinetics of excitonic-complex formation and annihilation. The exciton capture time by impurities is about 250 ps and independent of temperature (< 80 K) when the exciton density is comparable to the residual impurity density.
引用
收藏
页码:142 / 147
页数:6
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