Fast A Posteriori State Error Estimation for Reliable Frequency Sweeping in Microwave Circuits via the Reduced-Basis Method

被引:1
作者
de la Rubia, Valentin [1 ]
Chellappa, Sridhar [2 ]
Feng, Lihong [2 ]
Benner, Peter [2 ]
机构
[1] Univ Politecn Madrid, Dept Matemat Aplicada TIC, ETSI Telecomunicac, Madrid 28040, Spain
[2] Max Planck Inst Dynam Complex Tech Syst, Dept Computat Methods Syst & Control Theory, D-39106 Magdeburg, Germany
关键词
Microwave theory and techniques; Microwave circuits; Read only memory; Error analysis; Electromagnetics; Reliability; Computational modeling; Computer-aided engineering; design automation; error analysis; finite element method (FEM); Galerkin method; microwave circuits; reduced-basis method; reduced-order modeling; MODEL-ORDER REDUCTION; EXPANSION; SIMULATIONS; SCATTERING;
D O I
10.1109/TMTT.2022.3203726
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We develop a compact, reliable model order reduction approach for fast frequency sweeps in microwave circuits by means of the reduced-basis method. Contrary to what has been previously done, special emphasis is placed on certifying the accuracy of the reduced-order model (ROM) with respect to the original full-order model (FOM) in an effective and efficient way. Previous works on model order reduction (MOR) accuracy certification rely on costly a posteriori error estimators, which typically require expensive inf-sup constant evaluations of the underlying FOM. This scenario is often too time-consuming and unaffordable in electromagnetic applications. As a result, less expensive and heuristic error estimators are commonly used instead. Very often, one is interested in knowing about the full state vector, instead of just some output quantities derived from the full state. Therefore, error estimators for the full state vector become relevant. In this work, we detail the frequency behavior of both the electric field and the state error when an approximation to the electric field solution is carried out. Both the field quantities share the same frequency behavior. Based on this observation, we focus on the efficient estimation of the electric field state error and propose a fast evaluation of the ROM state error in the frequency band of analysis, minimizing the number of FOM evaluations. This methodology is of paramount importance to carry out a reliable fast frequency sweep in microwave circuits. Finally, real-life applications will illustrate the capabilities and efficiency of the proposed approach.
引用
收藏
页码:5172 / 5184
页数:13
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