Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips

被引：4

作者：

Arai, T. ^{[1
]}

Gritschneder, S. ^{[2
]}

Troeger, L. ^{[2
]}

Reichling, M. ^{[2
]}

机构：

[1] Kanazawa Univ, Grad Sch Nat Sci & Technol, Kanazawa, Ishikawa 9201192, Japan

[2] Univ Osnabruck, Fachbereich Phys, D-49076 Osnabruck, Germany

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2010年 / 28卷 / 06期

关键词：

CHEMICAL-IDENTIFICATION; CAF2(111) SURFACE; SIZE DEFECTS; GRAPHITE; IMAGES; STEPS; AFM;

D O I：

10.1116/1.3511505

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2(111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3511505]

引用

页码：1279 / 1283

页数：5

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