Low-Operating-Voltage Operation and Improvement in Sensitivity With Passivated OFET Sensors for Determining Total Dose Radiation

被引:12
作者
Raval, Harshil N. [1 ]
Rao, V. Ramgopal [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Ctr Excellence Nanoelect, Bombay 400076, Maharashtra, India
关键词
Array of organic field-effect transistor (OFET) sensors; improved sensitivity; ionizing radiation; FIELD-EFFECT TRANSISTOR; GATE; PERFORMANCE; ELECTRON; MOBILITY;
D O I
10.1109/LED.2010.2074179
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using high-k material in a gate dielectric stack, low-operating-voltage organic semiconducting material sensors for determining total dose radiation are proposed. To improve the stability of organic semiconducting layer in the atmospheric conditions, a thin silicon nitride layer deposited by hot-wire CVD process was used as a passivation layer. Furthermore, in order to achieve higher sensitivity, a parallel connection of organic field-effect transistors (OFETs) is explored in this letter. These sensors are exposed to ionizing radiation using a cobalt-60 radiation source for different total dose values. A three-times improvement in sensitivity was observed in the OFF current with a three-OFET array.
引用
收藏
页码:1482 / 1484
页数:3
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