Analysis of the Ebbesen experiment in the light of evanescent short range diffraction

被引：38

作者：

Vigoureux, JM ^{[1
]}

机构：

[1] UFR Sci & Tech La Bouloie, CNRS, UMR 6624, Phys Mol Lab, F-25030 Besancon, France

来源：

OPTICS COMMUNICATIONS | 2001年 / 198卷 / 4-6期

关键词：

near field optics; evanescent waves; Ebbesen experiment; sub-wavelength diffraction; metals;

D O I：

10.1016/S0030-4018(01)01522-X

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

I present a near field analysis of the Ebbesen experiment. The study of the variation of the detected intensity with respect to the angle of incidence of the light shows that the number of holes which physically intervening the effect is surprisingly small, I analyse that result which gives precious indications to understand that effect. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：257 / 263

页数：7

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