Software Reliability Growth Model Based on Half Logistic Distribution

被引:2
作者
Rao, B. Srinivasa [1 ]
Rao, B. Vara Prasad [2 ]
Kantam, R. R. L. [3 ]
机构
[1] RVR & JC Coll Engn, Dept Math & Humanities, Guntur 522019, Andhra Pradesh, India
[2] RVR & JC Coll Engn, Dept Comp Sci Engn, Guntur 522019, Andhra Pradesh, India
[3] Acharya Nagarjuna Univ, Dept Stat, Guntur 522010, Andhra Pradesh, India
关键词
AIC; Goel-Okumoto model; MLE; MSE; NHPP; SRGM; Yamada S-shaped model; TESTING-EFFORT; TIME; COST;
D O I
10.1520/JTE103270
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A non-homogeneous Poisson process with its mean value function generated by the cumulative distribution function of half logistic distribution is considered. It is modeled to assess the failure phenomenon of developed software. When the failure data are in the form of the number of failures in a given interval of time, the model parameters are estimated by the maximum likelihood method. The performance of the model is compared with two standard models [Goel, A. L., and Okumoto. K., "A Time Dependent Error Detection Rate Model for Software Reliability and Other Performance Measures," IEEE Trans. Reliab., Vol. 28(3), 1979, pp. 206-211; Yamada et al., "S-Shaped Reliability Growth Modeling for Software Error Detection," IEEE Trans. Reliab., Vol. 32(5), 1983, pp. 475-484] using two data sets. The release time of the software subject to a minimum expected cost is worked out and exemplified through illustrations.
引用
收藏
页码:1152 / 1157
页数:6
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