Adaptive Mesh Refinement Using in EOS

被引：0

作者：

Hu, Quan ^{[1
]}

Chen, Wenlong ^{[1
]}

Huang, Tao ^{[1
]}

Hu, Yulu ^{[1
]}

Zhu, Xiaofang ^{[1
]}

Li, Jianqing ^{[1
]}

Li, Bin ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, Sch Phys Elect, Natl Key Lab Sci & Technol Vacuum Elect, 4,Sect 2,North Jianshe Rd, Chengdu 610054, Peoples R China

来源：

2016 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC) | 2016年

关键词：

electron gun; adaptive mesh refinement; EOS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In order to improve the computational accuracy, an adaptive mesh refinement has been developed. This adaptive mesh refinement method has been used to improve the mesh for static field and electron trajectories respectively.

引用

页数：2

共 4 条

[1]

Hu Q.G., 2010, J. Int. Trade, P3

[2] Electron Optics Simulator: A Three-Dimensional Finite-Element Electron Gun and Collector Design Tool [J].

Huang, Tao ;

Hu, Quan ;

Yang, Zhong Hai ;

Li, Bin ;

Li, Jian Qing ;

Jin, Xiao Lin ;

Hu, Yu Lu ;

Zhu, Xiao Fang ;

Liao, Li ;

Xiao, Li ;

He, Guo Xian .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2009, 56 (01) :140-148

[3] Recent Developments to the Microwave Tube Simulator Suite [J].

Li, Bin ;

Li, Jian-Qing ;

Hu, Quan ;

Hu, Yu-Lu ;

Xu, Li ;

Huang, Tao ;

Jin, Xiao-Lin ;

Zhu, Xiao-Fang ;

Yang, Zhong-Hai .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (06) :1735-1741

[4]

Li Bin, 2010, IEEE T ELECTRON DEV, V56, P1696

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