Ultrafast carrier dynamics in Cu(In,Ga)Se2 thin films probed by femtosecond pump-probe spectroscopy

被引:15
作者
Chen, Shih-Chen [1 ]
Liao, Yu-Kuang [1 ,5 ]
Chen, Hsueh-Ju [1 ]
Chen, Chia-Hsiang [4 ]
Lai, Chih-Huang [4 ]
Chueh, Yu-Lun [4 ]
Kuo, Hao-Chung [2 ,3 ]
Wu, Kaung-Hsiung [1 ]
Juang, Jenh-Yih [1 ]
Cheng, Shun-Jen [1 ]
Hsieh, Tung-Po [5 ]
Kobayashi, Takayoshi [1 ]
机构
[1] Natl Chiao Tung Univ, Dept Electrophys, Hsinchu, Taiwan
[2] Natl Chiao Tung Univ, Dept Photon, Hsinchu, Taiwan
[3] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu, Taiwan
[4] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan
[5] Ind Technol Res Inst, Green Energy & Environm Res Labs, Next Generat Solar Cell Div, Compound Semicond Solar Cell Dept, Hsinchu, Taiwan
关键词
DENSITY-DEPENDENCE; SOLAR-CELLS; RECOMBINATION; SCATTERING; EFFICIENCY; GAAS;
D O I
10.1364/OE.20.012675
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ultrafast carrier dynamics in Cu(In,Ga)Se-2 films are investigated using femtosecond pump-probe spectroscopy. Samples prepared by direct sputtering and co-evaporation processes, which exhibited remarkably different crystalline structures and free carrier densities, were found to result in substantially different carrier relaxation and recombination mechanisms. For the sputtered CIGS films, electron-electron scattering and Auger recombination was observed, whereas for the co-evaporated CIGS films, bandgap renormalization accompanied by band filling effect and hot phonon relaxation was observed. The lifetime of defect-related recombination in the co-evaporated CIGS films is much longer than that in the direct-sputtered CIGS films, reflecting a better quality with higher energy conversion efficiency of the former. (c) 2012 Optical Society of America
引用
收藏
页码:12675 / 12681
页数:7
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