Transmission positrone-electron microscopes

被引:2
|
作者
Doyama, M [1 ]
Kogure, Y
Inoue, M
Hayashi, Y
Yoshiie, T
Kurihara, T
Oshima, R
Tsuno, K
机构
[1] Teikyo Univ Sci & Technol, Yamanashi 4090193, Japan
[2] Kyoto Univ, Reactor Res Inst, Kumatori, Osaka 5900451, Japan
[3] KEK, High Energy Accelerator res Organizat, IMSS, Sakai, Osaka 3050801, Japan
[4] Osaka Prefecture Univ, Res Inst Avd Sci & Technol, Sakai, Osaka 5998570, Japan
[5] JEOL Ltd, Akishima, Tokyo 1960021, Japan
来源
关键词
positron-electron microscopes; positron microscope; transmission positron microscope;
D O I
10.4028/www.scientific.net/MSF.445-446.471
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Positron microscopes are classified and discussed by their advantages and disadvantages. A transmission positron-electron microscope being built at KEK, Tsukuba, Japan is described.
引用
收藏
页码:471 / 473
页数:3
相关论文
共 50 条
  • [1] TRANSMISSION ELECTRON MICROSCOPES
    STOYANOV, PA
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1968, 32 (06): : 906 - +
  • [2] Remodeling design of commercial transmission electron microscopes to positron-electron transmission microscopes
    Doyama, M
    Inoue, M
    Kogure, Y
    Hayashi, Y
    Yoshiie, T
    Kurihara, T
    Tsuno, K
    APPLIED SURFACE SCIENCE, 2002, 194 (1-4) : 218 - 223
  • [3] TRANSMISSION SCANNING ELECTRON-MICROSCOPES
    STOYANOV, PA
    ANASKIN, IF
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1980, 47 (05): : 296 - 304
  • [4] The recent technologies on transmission electron microscopes
    Kishida, Haruo
    Zairyo to Kankyo/ Corrosion Engineering, 2003, 52 (07): : 340 - 346
  • [5] PRACTICAL AUTOALIGNMENT OF TRANSMISSION ELECTRON-MICROSCOPES
    KOSTER, AJ
    DERUIJTER, WJ
    ULTRAMICROSCOPY, 1992, 40 (02) : 89 - 107
  • [6] Quantification of the Information Limit of Transmission Electron Microscopes
    Barthel, J.
    Thust, A.
    PHYSICAL REVIEW LETTERS, 2008, 101 (20)
  • [7] Towards Automatic Control of Scanning Transmission Electron Microscopes
    Tejada, Arturo
    van der Hoeven, Saartje W.
    den Dekker, Arnold J.
    Van den Hof, Paul M. J.
    2009 IEEE CONTROL APPLICATIONS CCA & INTELLIGENT CONTROL (ISIC), VOLS 1-3, 2009, : 788 - 793
  • [8] DEFORMATION AND FRACTURE EXPERIMENTS IN TRANSMISSION ELECTRON-MICROSCOPES
    HORTON, JA
    JOURNAL OF METALS, 1988, 40 (11): : 7 - 7
  • [9] Standard sample for calibration of transmission electron microscopes nanometrology
    Bodunov, D. S.
    Gavrilenko, V. P.
    Zablotskii, A. V.
    Kuzin, A. A.
    Kuzin, A. Yu.
    Mityukhlyaev, V. B.
    Rakov, A. V.
    Todua, P. A.
    Filippov, M. N.
    MEASUREMENT TECHNIQUES, 2013, 55 (10) : 1137 - 1140
  • [10] Hierarchical Control for Drift Correction in Transmission Electron Microscopes
    Tarau, Alina N.
    Nuij, Pieter
    Steinbuch, Maarten
    2011 IEEE INTERNATIONAL CONFERENCE ON CONTROL APPLICATIONS (CCA), 2011, : 351 - 356