In situ study of noble metal atomic layer deposition processes using grazing incidence small angle X-ray scattering

被引:0
作者
Dendooven, J. [1 ]
Solano, E. [1 ,2 ]
Feng, J. -Y. [1 ]
Ramachandran, R. K. [1 ]
Minjauw, M. M. [1 ]
Van Daele, M. [1 ]
Coati, A. [3 ]
Hermida-Merino, D. [4 ]
Detavernier, C. [1 ]
机构
[1] Univ Ghent, Dept Solid State Sci, COCOON Grp, Krijgslaan 281-S1, B-9000 Ghent, Belgium
[2] ALBA Synchrotron Light Source, SWEET NCD Beamline, Carrer Llum 2-26, Cerdanyola Del Valles 08290, Spain
[3] Synchrotron SOLEIL, SixS Beamline, BP48, F-91192 Gif Sur Yvette, France
[4] ESRF European Synchrotron, DUBBLE Beamline BM126, Ave Martyrs,CS40220, F-38043 Grenoble, France
来源
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷
关键词
nanoparticles; nucleation; ALD; GISAXS; in situ;
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
MS-15-1
引用
收藏
页码:C136 / C136
页数:1
相关论文
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