A Simple and Universal Measurement Method for the Efficiency of Pulsed RF Power Amplifiers

被引:7
作者
Fang, Wen-Rao [1 ,2 ]
Huang, Wen-Hua [2 ]
Huang, Wen-Hui [1 ]
Fu, Chao [1 ,2 ]
Wang, Lu-Lu [2 ]
He, Tian-Wei [1 ]
Ma, Jian-Guo [3 ]
机构
[1] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China
[2] Northwest Inst Nucl Technol, Sci & Technol High Power Microwave Lab, Xian 710024, Peoples R China
[3] Guangdong Univ Technol, Sch Comp, Guangzhou 510006, Peoples R China
基金
中国国家自然科学基金;
关键词
Radio frequency; Current measurement; Pulse measurements; Voltage measurement; Power measurement; Power amplifiers; Clamps; Average efficiency; instantaneous efficiency; efficiency measurement; pulsed RF power amplifier; uncertainty analysis; various duties; AVERAGE-EFFICIENCY; I-V;
D O I
10.1109/ACCESS.2020.2976651
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a simple and universal measurement method for the average efficiency and instantaneous efficiency of pulsed RF power amplifiers. The average efficiency of the traditional definition varies with different duties and thus lacks universality, because of the DC power consumption outside the RF pulse. In our proposed method, the DC power consumption within a pulse period is divided into different parts. The parameters of each part can be extracted-from simple measurements of the average voltage and current under different duties. The average efficiency and instantaneous efficiency of different duties can be calculated with the extracted parameters. Since current clamps or oscilloscopes are not necessary to measure the instantaneous voltage and current, this solution can be easily implemented in a simple and cost-effective way, to expand the application into compact and sealed circuits. Measurement uncertainties under different duties were analyzed of the method. Experimental results of the proposed method are consistent with theoretical efficiencies, which help validate the method.
引用
收藏
页码:59200 / 59210
页数:11
相关论文
共 25 条
[1]  
[Anonymous], 2008, 9832008 ISO IEC
[2]   Parameters and Methods for ADCs Testing Compliant With the Guide to the Expression of Uncertainty in Measurements [J].
Baccigalupi, Aldo ;
D'Arco, Mauro ;
Liccardo, Annalisa .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2017, 66 (03) :424-431
[3]   Characterization of the transient behavior of a GaAs MESFET using dynamic I-V and S-parameter measurements [J].
Begin, M ;
Ghannouchi, FM ;
Beauregard, F ;
Selmi, L ;
Ricco, B .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (01) :231-237
[4]  
Cataliotti A., 2018, P IEEE INT INSTR MEA, P1
[5]   Two-Stage High-Efficiency Concurrent Dual-Band Harmonic-Tuned Power Amplifier [J].
Cheng, Qian-Fu ;
Fu, Hai-Peng ;
Zhu, Shou-Kui ;
Ma, Jian-Guo .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2016, 64 (10) :3232-3243
[6]  
신석우, 2011, [The Journal of The Korea Institute of Intelligent Transportation Systems, 한국ITS학회 논문지], V10, P42
[7]   Evaluation of measurement uncertainty based on the propagation of distributions using Monte Carlo simulation [J].
Cox, M ;
Harris, P ;
Siebert, BPL .
MEASUREMENT TECHNIQUES, 2003, 46 (09) :824-833
[8]   Processing magnetic sensor array data for AC current measurement in multiconductor systems [J].
D'Antona, G ;
Di Rienzo, L ;
Ottoboni, R ;
Manara, A .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (05) :1289-1295
[9]   A high average-efficiency SiGe HBT power amplifier for WCDMA handset applications [J].
Deng, JX ;
Gudem, PS ;
Larson, LE ;
Asbeck, PM .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2005, 53 (02) :529-537
[10]  
Dharma J., 2009, PERKINELMER, P1