Growth and X-ray characterization of ScFe4Al8 single crystals

被引：0

作者：

Talik, E

Winiarski, A

Kotur, B

Suski, W

机构：

[1] Silesian Univ, Inst Phys, PL-40007 Katowice, Poland

[2] Ivan Franko Natl Univ Lviv, Dept Inorgan Chem, UA-79005 Lvov, Ukraine

[3] Polish Acad Sci, W Trzebiatowski Inst Low Temp & Struct Res, PL-50950 Wroclaw, Poland

[4] Int Lab High Magnet Fields & Low Temp, PL-53421 Wroclaw, Poland

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 2001年 / 36卷 / 8-10期

关键词：

intermetallic compound; single crystal growth; X-ray topography;

D O I：

10.1002/1521-4079(200110)36:8/10<1119::AID-CRAT1119>3.0.CO;2-X

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Single crystals of the ScFe4Al8 intermetallic compound were obtained by the Czochralski method from a levitated melt. The X-ray powder diffraction, Laue and Berg-Barrett reflection topographies exhibit that the obtained single crystals were a good quality. The lattice parameters a = 8.652 +/- 0.004 Angstrom, c = 5.020 +/- 0.003 Angstrom were calculated from powder diffraction patterns.

引用

页码：1119 / 1122

页数：4

共 3 条

[1] Structure, magnetic and electrical properties of ScFexAl12-x alloys and their relation to the UFexAl12-x system [J].